Datasheet Texas Instruments F28M36H53B2ZWTQ — 数据表
| 制造商 | Texas Instruments |
| 系列 | F28M36H53B2 |
| 零件号 | F28M36H53B2ZWTQ |
协奏曲微控制器289-NFBGA -40至125
数据表
价格
状态
| Lifecycle Status | Active (Recommended for new designs) |
| Manufacture's Sample Availability | No |
打包
| Pin | 289 | 289 |
| Package Type | ZWT | ZWT |
| Industry STD Term | NFBGA | NFBGA |
| JEDEC Code | S-PBGA-N | S-PBGA-N |
| Package QTY | 90 | 90 |
| Device Marking | H53B2ZWTQ | F28M36 |
| Width (mm) | 16 | 16 |
| Length (mm) | 16 | 16 |
| Thickness (mm) | .9 | .9 |
| Pitch (mm) | .8 | .8 |
| Max Height (mm) | 1.4 | 1.4 |
| Mechanical Data | 下载 | 下载 |
参数化
| # of ADC Modules | 1 |
| 12-bit A/D | 24 #Channels |
| ADC Channels | 24 |
| ADC Conversion Time | 350 ns |
| ADC Resolution | 12-bit |
| ADC Sample & Hold | Dual |
| CAN | 2 |
| CPU | C28x, Cortex-M3 |
| DMA | 1 6-Ch DMA, 1 32-ch DMA Ch |
| EMIF | Yes |
| FPU | Yes |
| Flash | 1024 KB |
| Frequency | 150,100 MHz |
| GPIO | 124 |
| Generation | 28x + ARM Cortex M3 Concerto Series |
| I2C | 3 |
| IO Supply | 3.3 V |
| McBSP | 1 |
| Operating Temperature Range | -40 to 105,-40 to 125 C |
| PWM | 24 Ch |
| Package Group | NFBGA |
| Package Size: mm2:W x L | 289NFBGA: 256 mm2: 16 x 16(NFBGA) PKG |
| RAM | 232 KB |
| RISC Frequency | 75,100 MHz |
| Rating | Catalog |
| SPI | 5 |
| Timers | 3 32-Bit CPU,2 WD |
| Total On-Chip Memory | 1256 KB |
| Total Serial Ports | 2 CANs,3 I2C,5 SPI,6 SCI,1 McBSP |
| UART | 6 |
| USB | 1 |
生态计划
| RoHS | Compliant |
设计套件和评估模块
- Evaluation Modules & Boards: TMDSCNCD28M36
F28M36 Concerto Control Card
Lifecycle Status: Active (Recommended for new designs) - Evaluation Modules & Boards: TMDSADAP180TO100
180 to 100 Pin DIMM Adapter
Lifecycle Status: Active (Recommended for new designs) - Evaluation Modules & Boards: TMDSDOCK28M36
H63C2 Concerto Experimenter Kit
Lifecycle Status: Active (Recommended for new designs) - JTAG Emulators/ Analyzers: C2000-GANG
C2000 Gang Programmer
Lifecycle Status: Active (Recommended for new designs) - JTAG Emulators/ Analyzers: TMDSEMU100V2U-20T
XDS100v2 JTAG Debug Probe (20-pin cTI version)
Lifecycle Status: Active (Recommended for new designs) - JTAG Emulators/ Analyzers: TMDSEMU100V2U-14T
XDS100v2 JTAG Debug Probe (14-pin TI version)
Lifecycle Status: Active (Recommended for new designs) - JTAG Emulators/ Analyzers: TMDSEMU200-U
XDS200 USB Debug Probe
Lifecycle Status: Active (Recommended for new designs) - JTAG Emulators/ Analyzers: TMDSEMU560V2STM-UE
XDS560v2 System Trace USB & Ethernet Debug Probe
Lifecycle Status: Active (Recommended for new designs) - JTAG Emulators/ Analyzers: TMDSEMU560V2STM-U
XDS560v2 System Trace USB Debug Probe
Lifecycle Status: Active (Recommended for new designs)
应用须知
- Calculating Useful Lifetimes of Embedded ProcessorsPDF, 521 Kb, 档案已发布: Nov 11, 2014
This application report provides a methodology for calculating the useful lifetime of TI embedded processors (EP) under power when used in electronic systems. It is aimed at general engineers who wish to determine if the reliability of the TI EP meets the end system reliability requirement. - Calculator for CAN Bit Timing ParametersPDF, 37 Kb, 档案已发布: Mar 22, 2016
Controller Area Network (CAN) nodes use user-specified timing parameters to sample the asynchronous bitstream and recover the clock. These parameters are typically based on the frequency of the available reference oscillator. There may be several options available for a given frequency, and some of them will allow a looser oscillator tolerance than others. This application report details the creat
模型线
系列: F28M36H53B2 (3)
- F28M36H53B2ZWTQ F28M36H53B2ZWTS F28M36H53B2ZWTT
制造商分类
- Semiconductors > Microcontrollers (MCU) > Performance MCUs > Control + Automation > F28M3x