Datasheet Texas Instruments OPA551UA/2K5E4 — 数据表
| 制造商 | Texas Instruments |
| 系列 | OPA551 |
| 零件号 | OPA551UA/2K5E4 |
高压，大电流运算放大器8-SOIC -40至125
数据表
OPA55x High-Voltage, High-Current Operational Amplifiers datasheet
PDF, 1.2 Mb, 修订版: B, 档案已发布: Jan 7, 2016
从文件中提取
价格
状态
| Lifecycle Status | Active (Recommended for new designs) |
| Manufacture's Sample Availability | No |
打包
| Pin | 8 | 8 |
| Package Type | D | D |
| Industry STD Term | SOIC | SOIC |
| JEDEC Code | R-PDSO-G | R-PDSO-G |
| Package QTY | 2500 | 2500 |
| Carrier | LARGE T&R | LARGE T&R |
| Device Marking | OPA | 551UA |
| Width (mm) | 3.91 | 3.91 |
| Length (mm) | 4.9 | 4.9 |
| Thickness (mm) | 1.58 | 1.58 |
| Pitch (mm) | 1.27 | 1.27 |
| Max Height (mm) | 1.75 | 1.75 |
| Mechanical Data | 下载 | 下载 |
参数化
| Additional Features | N/A |
| Architecture | FET |
| CMRR(Min) | 92 dB |
| CMRR(Typ) | 102 dB |
| GBW(Typ) | 3 MHz |
| Input Bias Current(Max) | 100 pA |
| Iq per channel(Max) | 8.5 mA |
| Iq per channel(Typ) | 7 mA |
| Number of Channels | 1 |
| Offset Drift(Typ) | 7 uV/C |
| Operating Temperature Range | -40 to 125 C |
| Output Current(Typ) | 380 mA |
| Package Group | SOIC |
| Package Size: mm2:W x L | 8SOIC: 29 mm2: 6 x 4.9(SOIC) PKG |
| Rail-to-Rail | No |
| Rating | Catalog |
| Slew Rate(Typ) | 15 V/us |
| Total Supply Voltage(Max) | 60 +5V=5, +/-5V=10 |
| Total Supply Voltage(Min) | 8 +5V=5, +/-5V=10 |
| Vos (Offset Voltage @ 25C)(Max) | 3 mV |
生态计划
| RoHS | Compliant |
设计套件和评估模块
- Evaluation Modules & Boards: OPAMPEVM
Universal Operational Amplifier Evaluation Module
Lifecycle Status: Active (Recommended for new designs)
应用须知
- Optoelectronics Circuit CollectionPDF, 261 Kb, 档案已发布: Jun 11, 2001
This application report presents a collection of analog circuits that may be useful in electro-optic applications such as optical networking. The circuits are Avalanche Photodiode Bias Supply 1; Linear TEC Driver-1, -2, and -3; Laser Diode Driver-1 and -2; and Temperature Under- and Over-range Sensing with a Window Comparator. - MTTF, Failrate, Reliability, and Life TestingPDF, 51 Kb, 档案已发布: Oct 4, 2000
At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr
模型线
系列: OPA551 (12)
制造商分类
- Semiconductors > Amplifiers > Operational Amplifiers (Op Amps) > Power Op Amps