Datasheet Texas Instruments ADS5413 — 数据表

制造商Texas Instruments
系列ADS5413
Datasheet Texas Instruments ADS5413

12位,65MSPS,1.0GHz输入带宽模数转换器(ADC)

数据表

ADS5413: 12-bit, 65 MSPS CommsADC Analog-to-Digital Converter datasheet
PDF, 466 Kb, 档案已发布: Dec 16, 2003
从文件中提取

价格

状态

ADS5413IPHP
Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

打包

ADS5413IPHP
N1
Pin48
Package TypePHP
Industry STD TermHTQFP
JEDEC CodeS-PQFP-G
Package QTY250
CarrierJEDEC TRAY (10+1)
Device MarkingAZ5413
Width (mm)7
Length (mm)7
Thickness (mm)1
Pitch (mm).5
Max Height (mm)1.2
Mechanical Data下载

参数化

Parameters / ModelsADS5413IPHP
ADS5413IPHP
# Input Channels1
Analog Input BW, MHz1000
ArchitecturePipeline
DNL(Max), +/-LSB0.5
DNL(Typ), +/-LSB0.5
ENOB, Bits11.3
INL(Max), +/-LSB1
INL(Typ), +/-LSB1
Input BufferNo
Input Range, Vp-p2.25
InterfaceParallel LVDS
Operating Temperature Range, C-40 to 85
Package GroupHTQFP
Package Size: mm2:W x L, PKG48HTQFP: 81 mm2: 9 x 9(HTQFP)
Power Consumption(Typ), mW400
RatingCatalog
Reference ModeExt,Int
Resolution, Bits12
SFDR, dB79
SINAD, dB67.8
SNR, dB68.5
Sample Rate(Max), MSPS65

生态计划

ADS5413IPHP
RoHSCompliant

应用须知

  • Standard Procedure Direct Measurement Sub-picosecond RMS Jitter High-Speed ADC
    PDF, 1.0 Mb, 档案已发布: Jun 30, 2004
  • How to Calculate the Period Jitter from the SSCR for High-Speed ADCs
    PDF, 218 Kb, 档案已发布: Dec 17, 2003
    This document introduces a general formula to translate the phase noise of a clock source, rated via the Single Sideband to Carrier Ratio, to the cycle-to-cycle jitter of the oscillation period. The link allows to seamlessly aggregate the external clock source phase noise, usually given in dBc/Hz, to the phase stability figure of the on-chip clock synchronization circuitry, usually rated in ps-RMS
  • High-Speed Analog-to-Digital Converter Basics
    PDF, 1.1 Mb, 档案已发布: Jan 11, 2012
    The goal of this document is to introduce a wide range of theories and topics that are relevant tohigh-speed analog-to-digital converters (ADC). This document provides details on sampling theorydata-sheet specifications ADC selection criteria and evaluation methods clock jitter and other commonsystem-level concerns. In addition some end-users will want to extend the performance capabil
  • Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)
    PDF, 1.2 Mb, 修订版: A, 档案已发布: Jul 19, 2013
  • Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)
    PDF, 2.0 Mb, 修订版: A, 档案已发布: May 22, 2015
  • Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
    PDF, 376 Kb, 档案已发布: Apr 28, 2009
    This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
  • Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
    PDF, 327 Kb, 修订版: A, 档案已发布: Sep 10, 2010
    This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
  • Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
    PDF, 2.3 Mb, 档案已发布: Jun 2, 2008
    This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
  • CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
    PDF, 424 Kb, 档案已发布: Jun 8, 2008
    Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
  • Principles of Data Acquisition and Conversion (Rev. A)
    PDF, 132 Kb, 修订版: A, 档案已发布: Apr 16, 2015
  • A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)
    PDF, 425 Kb, 修订版: B, 档案已发布: Oct 9, 2011
    This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
  • Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)
    PDF, 69 Kb, 修订版: A, 档案已发布: May 18, 2015

模型线

系列: ADS5413 (1)

制造商分类

  • Semiconductors> Data Converters> Analog-to-Digital Converters (ADCs)> High Speed ADCs (>10MSPS)