Datasheet Texas Instruments ADS5527 — 数据表

制造商Texas Instruments
系列ADS5527
Datasheet Texas Instruments ADS5527

12位210MSPS模数转换器(ADC)

数据表

12-Bit, 210 MSPS ADC With DDR LVDS/CMOS Outputs datasheet
PDF, 2.1 Mb, 修订版: A, 档案已发布: May 7, 2007
从文件中提取

价格

状态

ADS5527IRGZRADS5527IRGZTADS5527IRGZTG4
Lifecycle StatusActive (Recommended for new designs)Active (Recommended for new designs)Active (Recommended for new designs)
Manufacture's Sample AvailabilityNoNoNo

打包

ADS5527IRGZRADS5527IRGZTADS5527IRGZTG4
N123
Pin484848
Package TypeRGZRGZRGZ
Industry STD TermVQFNVQFNVQFN
JEDEC CodeS-PQFP-NS-PQFP-NS-PQFP-N
Package QTY2500250
CarrierLARGE T&RSMALL T&R
Device MarkingAZ5527AZ5527
Width (mm)777
Length (mm)777
Thickness (mm).9.9.9
Pitch (mm).5.5.5
Max Height (mm)111
Mechanical Data下载下载下载

参数化

Parameters / ModelsADS5527IRGZR
ADS5527IRGZR
ADS5527IRGZT
ADS5527IRGZT
ADS5527IRGZTG4
ADS5527IRGZTG4
# Input Channels111
Analog Input BW, MHz800800
Analog Input BW(MHz)800
Approx. Price (US$)76.73 | 100u
ArchitecturePipelinePipelinePipeline
DNL(Max), +/-LSB0.50.5
DNL(Max)(+/-LSB)0.5
DNL(Typ), +/-LSB0.50.5
DNL(Typ)(+/-LSB)0.5
ENOB, Bits11.411.4
ENOB(Bits)11.4
INL(Max), +/-LSB11
INL(Max)(+/-LSB)1
INL(Typ), +/-LSB11
INL(Typ)(+/-LSB)1
Input BufferNoNoNo
Input Range, Vp-p22
Input Range(Vp-p)2
InterfaceParallel CMOS,Parallel LVDSParallel CMOS,Parallel LVDSParallel CMOS
Parallel LVDS
Operating Temperature Range, C-40 to 85-40 to 85
Operating Temperature Range(C)-40 to 85
Package GroupVQFNVQFNVQFN
Package Size: mm2:W x L, PKG48VQFN: 49 mm2: 7 x 7(VQFN)48VQFN: 49 mm2: 7 x 7(VQFN)
Package Size: mm2:W x L (PKG)48VQFN: 49 mm2: 7 x 7(VQFN)
Power Consumption(Typ), mW12301230
Power Consumption(Typ)(mW)1230
RatingCatalogCatalogCatalog
Reference ModeExt,IntExt,IntExt
Int
Resolution, Bits1212
Resolution(Bits)12
SFDR, dB8484
SFDR(dB)84
SINAD, dB70.270.2
SINAD(dB)70.2
SNR, dB70.570.5
SNR(dB)70.5
Sample Rate(Max), MSPS210210
Sample Rate(Max)(MSPS)210

生态计划

ADS5527IRGZRADS5527IRGZTADS5527IRGZTG4
RoHSCompliantCompliantNot Compliant
Pb FreeNo

应用须知

  • QFN Layout Guidelines
    PDF, 1.3 Mb, 档案已发布: Jul 28, 2006
    Board layout and stencil information for most Texas Instruments Quad Flat No-Lead (QFN) devices is provided in their data sheets. This document helps printed-circuit board designers understand and better use this information for optimal designs.
  • CDCE62005 as Clock Solution for High-Speed ADCs
    PDF, 805 Kb, 档案已发布: Sep 4, 2008
    TI has introduced a family of devices well-suited to meet the demands for high-speed ADC devices such as the ADS5527 which is capable of sampling up to 210 MSPS. To realize the full potential of these high-performance products it is imperative to provide a low phase noise clock source. The CDCE62005 clock synthesizer chip offers a real-world clocking solution to meet these stringent requirements
  • Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)
    PDF, 2.0 Mb, 修订版: A, 档案已发布: May 22, 2015
  • Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)
    PDF, 1.2 Mb, 修订版: A, 档案已发布: Jul 19, 2013
  • Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
    PDF, 376 Kb, 档案已发布: Apr 28, 2009
    This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
  • Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
    PDF, 327 Kb, 修订版: A, 档案已发布: Sep 10, 2010
    This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
  • Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
    PDF, 2.3 Mb, 档案已发布: Jun 2, 2008
    This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
  • CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
    PDF, 424 Kb, 档案已发布: Jun 8, 2008
    Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
  • Principles of Data Acquisition and Conversion (Rev. A)
    PDF, 132 Kb, 修订版: A, 档案已发布: Apr 16, 2015
  • A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)
    PDF, 425 Kb, 修订版: B, 档案已发布: Oct 9, 2011
    This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
  • Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)
    PDF, 69 Kb, 修订版: A, 档案已发布: May 18, 2015

模型线

制造商分类

  • Semiconductors> Data Converters> Analog-to-Digital Converters (ADCs)> High Speed ADCs (>10MSPS)