Datasheet Texas Instruments DAC5681Z — 数据表
| 制造商 | Texas Instruments |
| 系列 | DAC5681Z |
16位1.0GSPS 1x-4x内插数模转换器（DAC）
数据表
价格
状态
| DAC5681ZIRGCR | DAC5681ZIRGCT | |
|---|---|---|
| Lifecycle Status | Active (Recommended for new designs) | Active (Recommended for new designs) |
| Manufacture's Sample Availability | No | Yes |
打包
| DAC5681ZIRGCR | DAC5681ZIRGCT | |
|---|---|---|
| N | 1 | 2 |
| Pin | 64 | 64 |
| Package Type | RGC | RGC |
| Industry STD Term | VQFN | VQFN |
| JEDEC Code | S-PQFP-N | S-PQFP-N |
| Package QTY | 2000 | 250 |
| Carrier | LARGE T&R | SMALL T&R |
| Device Marking | DAC5681ZI | DAC5681ZI |
| Width (mm) | 9 | 9 |
| Length (mm) | 9 | 9 |
| Thickness (mm) | .88 | .88 |
| Pitch (mm) | .5 | .5 |
| Max Height (mm) | 1 | 1 |
| Mechanical Data | 下载 | 下载 |
参数化
| Parameters / Models | DAC5681ZIRGCR | DAC5681ZIRGCT |
|---|---|---|
| Architecture | Current Sink | Current Sink |
| DAC Channels | 1 | 1 |
| Interface | Parallel LVDS | Parallel LVDS |
| Interpolation | 1x,2x,4x | 1x,2x,4x |
| Operating Temperature Range, C | -40 to 85 | -40 to 85 |
| Package Group | VQFN | VQFN |
| Package Size: mm2:W x L, PKG | 64VQFN: 81 mm2: 9 x 9(VQFN) | 64VQFN: 81 mm2: 9 x 9(VQFN) |
| Power Consumption(Typ), mW | 800 | 800 |
| Rating | Catalog | Catalog |
| Resolution, Bits | 16 | 16 |
| SFDR, dB | 81 | 81 |
| Sample / Update Rate, MSPS | 1000 | 1000 |
生态计划
| DAC5681ZIRGCR | DAC5681ZIRGCT | |
|---|---|---|
| RoHS | Compliant | Compliant |
应用须知
- Passive Terminations for Current Output DACsPDF, 244 Kb, 档案已发布: Nov 10, 2008
The correct implementation of the high-speed DAC output termination is critical to achieving the best possible performance. The typical application involves choosing the correct network to create the necessary dc bias levels and correct effective impedance load to keep the output voltage within the compliance levels. This ensures that the maximum output signal amplitude and optimum ac performance - High Speed Digital-to-Analog Converters Basics (Rev. A)PDF, 829 Kb, 修订版: A, 档案已发布: Oct 23, 2012
- Phase Noise Performance and Jitter Cleaning Ability of CDCE72010PDF, 2.3 Mb, 档案已发布: Jun 2, 2008
This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig - CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital ConvertersPDF, 424 Kb, 档案已发布: Jun 8, 2008
Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
模型线
系列: DAC5681Z (2)
制造商分类
- Semiconductors> Data Converters> Digital-to-Analog Converters (DACs)> High Speed DACs (>10MSPS)