Datasheet Texas Instruments SCAN926260TUF/NOPB — 数据表

SCAN926260
www.ti.com SNLS153H – JUNE 2002 – REVISED APRIL 2013 SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST
Check for Samples: SCAN926260 FEATURES DESCRIPTION The SCAN926260 integrates six 10-bit deserializer
devices into a single chip. The SCAN926260 can
simultaneously deserialize up to six data streams that
have been serialized by TI’s 10-bit Bus LVDS
serializers. In addition, the SCAN926260 is compliant
with IEEE standard 1149.1 and also features an AtSpeed Built-In Self Test (BIST). For more details,
please see the sections titled IEEE 1149.1 Test
Modes and BIST Alone Test Modes. 1 2 Deserializes One to Six Bus LVDS Input Serial
Data Streams with Embedded Clocks
IEEE 1149.1 (JTAG) Compliant and At-Speed
BIST Test Modes
Parallel Clock Rate 16-66MHz
On Chip Filtering for PLL
High Impedance Inputs Upon Power Off (Vcc =
0V)
Single Power Supply at +3.3V
196-Pin NFBGA Package (Low-Profile Ball Grid
Array) Package
Industrial Temperature Range Operation:
-40В°C to +85В°C
ROUTn[0:9] and RCLKn Default High when …