SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E -FEBRUARY 1990 -REVISED JULY 1996 D Members of the Texas Instruments D
D
D
D D SCOPEв„ў Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to ’F244 and
’BCT244 in the Normal-Function Mode
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Test Operation Synchronous to Test
Access Port (TAP)
Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
SCOPEв„ў Instruction Set
-IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP
and HIGHZ
-Parallel-Signature Analysis at Inputs …
