Datasheet Texas Instruments SNJ54BCT8373AFK — 数据表

制造商Texas Instruments
系列SN54BCT8373A
零件号SNJ54BCT8373AFK
Datasheet Texas Instruments SNJ54BCT8373AFK

扫描带有八进制D型锁存器的测试设备28-LCCC -55至125

数据表

Scan Test Devices With Octal D-Type Latches datasheet
PDF, 421 Kb, 修订版: F, 档案已发布: Jul 1, 1996
从文件中提取

价格

状态

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

打包

Pin28282828
Package TypeFKFKFKFK
Industry STD TermLCCCLCCCLCCCLCCC
JEDEC CodeS-CQCC-NS-CQCC-NS-CQCC-NS-CQCC-N
Package QTY1111
CarrierTUBETUBETUBETUBE
Device Marking5962-SNJ54BCT9172501M3A8373AFK
Width (mm)11.4311.4311.4311.43
Length (mm)11.4311.4311.4311.43
Thickness (mm)1.831.831.831.83
Pitch (mm)1.271.271.271.27
Max Height (mm)2.032.032.032.03
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参数化

Bits8
ICC @ Nom Voltage(Max)52 mA
Input TypeTTL
Operating Temperature Range-55 to 125 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Output TypeTTL
Package GroupLCCC
Package Size: mm2:W x L28LCCC: 131 mm2: 11.43 x 11.43(LCCC) PKG
RatingMilitary
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
tpd @ Nom Voltage(Max)9.5 ns

生态计划

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模型线

制造商分类

  • Semiconductors > Space & High Reliability > Logic Products > Specialty Logic Products > Boundary Scan (JTAG)