Datasheet Texas Instruments SNJ54LVT18502HV — 数据表

制造商Texas Instruments
系列SN54LVT18502
零件号SNJ54LVT18502HV

具有18位通用总线收发器的3.3V ABT扫描测试设备68-CFP -55至125

数据表

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
PDF, 498 Kb, 档案已发布: Jul 1, 1996

价格

状态

Lifecycle StatusObsolete (Manufacturer has discontinued the production of the device)
Manufacture's Sample AvailabilityNo

打包

Pin68
Package TypeHV
Industry STD TermCFP
JEDEC CodeS-GQFP-F
Width (mm)12.51
Length (mm)12.51
Thickness (mm)3.56
Pitch (mm).635
Max Height (mm)3.86
Mechanical Data下载

生态计划

RoHSNot Compliant
Pb FreeNo

应用须知

  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, 修订版: A, 档案已发布: Mar 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, 档案已发布: Dec 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.

模型线

系列: SN54LVT18502 (1)
  • SNJ54LVT18502HV

制造商分类

  • Semiconductors > Space & High Reliability > Logic Products > Specialty Logic Products > Boundary Scan (JTAG)