Datasheet Texas Instruments SN74LVTH182512 — 数据表
制造商 | Texas Instruments |
系列 | SN74LVTH182512 |
具有18位通用总线收发器的3.3V ABT扫描测试设备
数据表
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers datasheet
PDF, 735 Kb, 修订版: B, 档案已发布: Oct 1, 1997
从文件中提取
价格
状态
SN74LVTH182512DGGR | |
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Lifecycle Status | Active (Recommended for new designs) |
Manufacture's Sample Availability | No |
打包
SN74LVTH182512DGGR | |
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N | 1 |
Pin | 64 |
Package Type | DGG |
Industry STD Term | TSSOP |
JEDEC Code | R-PDSO-G |
Package QTY | 2000 |
Carrier | LARGE T&R |
Device Marking | LVTH182512 |
Width (mm) | 6.1 |
Length (mm) | 17 |
Thickness (mm) | 1.15 |
Pitch (mm) | .5 |
Max Height (mm) | 1.2 |
Mechanical Data | 下载 |
参数化
Parameters / Models | SN74LVTH182512DGGR |
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Bits | 18 |
F @ Nom Voltage(Max), Mhz | 160 |
ICC @ Nom Voltage(Max), mA | 24 |
Operating Temperature Range, C | -40 to 85 |
Output Drive (IOL/IOH)(Max), mA | 64/-32 |
Package Group | TSSOP |
Package Size: mm2:W x L, PKG | 64TSSOP: 138 mm2: 8.1 x 17(TSSOP) |
Rating | Catalog |
Technology Family | LVT |
VCC(Max), V | 3.6 |
VCC(Min), V | 2.7 |
Voltage(Nom), V | 3.3 |
tpd @ Nom Voltage(Max), ns | 5.7 |
生态计划
SN74LVTH182512DGGR | |
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RoHS | Compliant |
应用须知
- Programming CPLDs Via the 'LVT8986 LASPPDF, 819 Kb, 档案已发布: Nov 1, 2005
This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to - LVT Family Characteristics (Rev. A)PDF, 98 Kb, 修订版: A, 档案已发布: Mar 1, 1998
To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti - LVT-to-LVTH ConversionPDF, 84 Kb, 档案已发布: Dec 8, 1998
Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed. - Bus-Hold CircuitPDF, 418 Kb, 档案已发布: Feb 5, 2001
When designing systems that include CMOS devices, designers must pay special attention to the operating condition in which all of the bus drivers are in an inactive, high-impedance condition (3-state). Unless special measures are taken, this condition can lead to undefined levels and, thus, to a significant increase in the device?s power dissipation. In extreme cases, this leads to oscillation of
模型线
系列: SN74LVTH182512 (1)
制造商分类
- Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic