Datasheet Texas Instruments SN74LVTH18514 — 数据表

制造商Texas Instruments
系列SN74LVTH18514
Datasheet Texas Instruments SN74LVTH18514

具有20位通用总线收发器的3.3V ABT扫描测试设备

数据表

3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers datasheet
PDF, 579 Kb, 修订版: C, 档案已发布: Mar 29, 1998
从文件中提取

价格

状态

SN74LVTH18514DGGR
Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

打包

SN74LVTH18514DGGR
N1
Pin64
Package TypeDGG
Industry STD TermTSSOP
JEDEC CodeR-PDSO-G
Package QTY2000
CarrierLARGE T&R
Device MarkingLVTH18514
Width (mm)6.1
Length (mm)17
Thickness (mm)1.15
Pitch (mm).5
Max Height (mm)1.2
Mechanical Data下载

参数化

Parameters / ModelsSN74LVTH18514DGGR
SN74LVTH18514DGGR
Bits20
F @ Nom Voltage(Max), Mhz160
Operating Temperature Range, C-40 to 85
Output Drive (IOL/IOH)(Max), mA64/-32
Package GroupTSSOP
Package Size: mm2:W x L, PKG64TSSOP: 138 mm2: 8.1 x 17(TSSOP)
RatingCatalog
Technology FamilyLVT
VCC(Max), V3.6
VCC(Min), V2.7
Voltage(Nom), V3.3

生态计划

SN74LVTH18514DGGR
RoHSCompliant

应用须知

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, 档案已发布: Nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, 修订版: A, 档案已发布: Mar 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, 档案已发布: Dec 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.
  • Bus-Hold Circuit
    PDF, 418 Kb, 档案已发布: Feb 5, 2001
    When designing systems that include CMOS devices, designers must pay special attention to the operating condition in which all of the bus drivers are in an inactive, high-impedance condition (3-state). Unless special measures are taken, this condition can lead to undefined levels and, thus, to a significant increase in the device?s power dissipation. In extreme cases, this leads to oscillation of

模型线

系列: SN74LVTH18514 (1)

制造商分类

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic