Datasheet Texas Instruments SN74LVTH18646APMG4 — 数据表

制造商Texas Instruments
系列SN74LVTH18646A
零件号SN74LVTH18646APMG4
Datasheet Texas Instruments SN74LVTH18646APMG4

具有18位收发器和寄存器的3.3V ABT扫描测试设备64-LQFP -40至85

数据表

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers datasheet
PDF, 600 Kb, 修订版: D, 档案已发布: Jun 1, 1997
从文件中提取

价格

状态

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

打包

Pin64
Package TypePM
Industry STD TermLQFP
JEDEC CodeS-PQFP-G
Package QTY160
CarrierJEDEC TRAY (10+1)
Device MarkingLVTH18646A
Width (mm)10
Length (mm)10
Thickness (mm)1.4
Pitch (mm).5
Max Height (mm)1.6
Mechanical Data下载

参数化

Bits18
F @ Nom Voltage(Max)160 Mhz
ICC @ Nom Voltage(Max)24 mA
Operating Temperature Range-40 to 85 C
Output Drive (IOL/IOH)(Max)64/-32 mA
Package GroupLQFP
Package Size: mm2:W x L64LQFP: 144 mm2: 12 x 12(LQFP) PKG
RatingCatalog
Technology FamilyLVT
VCC(Max)3.6 V
VCC(Min)2.7 V
Voltage(Nom)3.3 V
tpd @ Nom Voltage(Max)4.7 ns

生态计划

RoHSCompliant

应用须知

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, 档案已发布: Nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, 修订版: A, 档案已发布: Mar 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, 档案已发布: Dec 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.
  • Bus-Hold Circuit
    PDF, 418 Kb, 档案已发布: Feb 5, 2001
    When designing systems that include CMOS devices, designers must pay special attention to the operating condition in which all of the bus drivers are in an inactive, high-impedance condition (3-state). Unless special measures are taken, this condition can lead to undefined levels and, thus, to a significant increase in the device?s power dissipation. In extreme cases, this leads to oscillation of

模型线

系列: SN74LVTH18646A (2)

制造商分类

  • Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic