TL16C752B-EP
www.ti.com SGLS153B – FEBRUARY 2003 – REVISED DECEMBER 2007 3.3 V DUAL UART WITH 64-BYTE FIFO
Check for Samples: TL16C752B-EP FEATURES 1 (1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits. Fast Access Time 2 Clock Cycle IOR/IOW
Pulse Width
Programmable Sleep Mode
Programmable Serial Interface Characteristics
– 5-Bit, 6-Bit, 7-Bit, or 8-Bit Characters
– Even, Odd, or No Parity Bit Generation and
Detection
– 1, 1.5, or 2 Stop Bit Generation
False Start Bit Detection
Complete Status Reporting Capabilities in
Both Normal and Sleep Mode
Line Break Generation and Detection
Internal Test and Loopback Capabilities …
