Datasheet Analog Devices 5962L8856504VDA — 数据表

REVISIONS
LTR DATE (YR-MO-DA) APPROVED A Add case outline 2 for device types 01 and 02. Update format. Editorial
changes throughout. DESCRIPTION 89-11-07 M. A. Frye B Changes to large-signal voltage gain test and to the output voltage swing test.
Changes IAW NOR 5962-R193-93. 93-08-26 M. A. Frye C Add case outline K. Change boilerplate to add one-part part numbers.
Add delta test limits. Redrawn. 96-11-25 R. Monnin D Add radiation hardness requirements. Update boilerplate. -rrp 98-06-19 R. Monnin E Change to the slew rate test condition AVCL in table I. -rrp 00-10-04 R. Monnin 03-03-19 R. Monnin 11-04-06 C. Saffle Add case outline D. Remove radiation exposure circuit. Changes made to
1.2.4, 1.3, 3.2.3, figure 1, and table IIA. Update boilerplate to reflect current
requirements. -rrp
Update drawing to current requirements. Deleted unused group E boilerplate
paragraphs. –rrp F
G
H Add device types 03 and 04 tested at low dose rate. Make changes to 1.2.2,
1.5, Table I, figure 1, Table IIB, 4.4.4.1. -ro 11-11-16 C. Saffle J Update document paragraphs to current MIL-PRF-385345 requirements. -ro 17-11-06 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
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REV STATUS REV J J J J J J J J J J J OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY
Gary Zahn STANDARD
MICROCIRCUIT
DRAWING DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.dla.mil/landandmaritime CHECKED BY
Ray Monnin …