Datasheet LT1715 (Analog Devices) - 8
| 制造商 | Analog Devices |
| 描述 | 4ns, 150MHz Dual Comparator with Independent Input/Output Supplies |
| 页数 / 页 | 20 / 8 — TEST CIRCUITS. Response Time Test Circuit |
| 文件格式/大小 | PDF / 255 Kb |
| 文件语言 | 英语 |
TEST CIRCUITS. Response Time Test Circuit
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文件文字版本
LT1715
TEST CIRCUITS Response Time Test Circuit
+Vs – VCM 0V V 0.01μF CC – VCM –100mV 25Ω + DUT 10× SCOPE PROBE 25Ω 1/2 LT1715 50k (CIN ≈ 10pF) 0.1μF – 130Ω 0.01μF V1* 50Ω PULSE 2N3866 0V IN 1N5711 VEE – VCM –3V –VCM 50Ω 400Ω 750Ω *V1 = –1000 • (OVERDRIVE + V + TRIP ) NOTE: RISING EDGE TEST SHOWN. –5V 1715 TC02 FOR FALLING EDGE, REVERSE LT1719 INPUTS 1715fa 8
TEST CIRCUITS Response Time Test Circuit
+Vs – VCM 0V V 0.01μF CC – VCM –100mV 25Ω + DUT 10× SCOPE PROBE 25Ω 1/2 LT1715 50k (CIN ≈ 10pF) 0.1μF – 130Ω 0.01μF V1* 50Ω PULSE 2N3866 0V IN 1N5711 VEE – VCM –3V –VCM 50Ω 400Ω 750Ω *V1 = –1000 • (OVERDRIVE + V + TRIP ) NOTE: RISING EDGE TEST SHOWN. –5V 1715 TC02 FOR FALLING EDGE, REVERSE LT1719 INPUTS 1715fa 8