Datasheet LTC2123 (Analog Devices) - 6

LTC2123
TIMING CHARACTERISTICS The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
tSU_SYN SYNC~ to DEVCLK Set-Up Time (Note 8) l 0.6 ns tH_SYN DEVCLK to SYNC~ Hold Time (Note 8) l 0.6 ns tSU_SYS SYSREF to DEVCLK Set-Up Time (Note 8) l 0.2 (tDCK – 0.32) ns tH_SYS DEVCLK to SYSREF Hold Time (Note 8) l 0.32 ns LATP2 Pipeline Latency, 2-Lane Mode (Note 10) l 13.5 13.5 tS LATP4 Pipeline Latency, 4-Lane Mode (Note 10) l 19.5 19.5 tS tDS Delay from DEVCLK to Serial Data Out (Note 8) l 0.6 tS LATSC2 Latency from SYNC~ Assertion to (Note 10) l 10 10 tS COMMA Out, 2-Lane Mode LATSC4 Latency from SYNC~ Assertion to (Note 10) l 20 20 tS COMMA Out, 4-Lane Mode LATSL2 Latency from SYNC~ De-assertion to (Notes 10, 11) l 6 6 tS LAS Out, 2-Lane Mode LATSL4 Latency from SYNC~ De-assertion to (Notes 10, 11) l 12 12 tS LAS Out, 4-Lane Mode LATOF Overflow Latency (Note 10) l 6 6 tS tD _OF1X Analog Delay of OF with 1X_CLK (Note 8) l 1.4 1.7 2.0 ns tD _OF2X Analog Delay of OF with 2X_CLK (Note 8) l 1.6 1.9 2.2 ns
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 6:
Integral nonlinearity is defined as the deviation of a code from a may cause permanent damage to the device. Exposure to any Absolute best fit straight line to the transfer curve. The deviation is measured from Maximum Rating condition for extended periods may affect device the center of the quantization band. reliability and lifetime.
Note 7:
Offset error is the offset voltage measured from –0.5LSB when the
Note 2:
All voltage values are with respect to GND (unless otherwise noted). output code flickers between 01 1111 1111 1111 and 10 0000 0000 0000.
Note 3:
When these pin voltages are taken below GND or above VDD, they
Note 8:
Guaranteed by design, not subject to test. will be clamped by internal diodes. This product can handle input currents
Note 9:
Recommended operating conditions. of greater than 100mA below GND or above VDD without latchup.
Note 10:
When the “2X_CLK” SPI register bit is set, the DEVCLK frequency
Note 4:
When these pin voltages are taken below GND they will be is 2X the sampling frequency. When the “2X_CLK” bit is not set, the clamped by internal diodes. When these pin voltages are taken above VDD they will not be clamped by internal diodes. This product can handle input DEVCLK frequency is equal to the sampling frequency. Latency is currents of greater than 100mA below GND without latch-up. measured in units of sampling periods (tS), where tS is the inverse of the sampling frequency.
Note 5:
VDD = 1.8V, fSAMPLE = 250MHz, differential DEVCLK+/DEVCLK– = 2V
Note 11:
When in subclass 0, the Lane Alignment Sequence (LAS) latency P-P sine wave, input range = 1.5VP-P with differential drive, unless otherwise noted. measurement begins at the start of the frame following the detection of SYNC~ de-assertion. When in subclasses 1 or 2 this LAS latency measurement begins at the start of the first multiframe following the detection of SYNC~ de-assertion. 2123fc 6 For more information www.linear.com/LTC2123 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Converter Characteristics Pin Configuration Analog Input Dynamic Accuracy Internal Reference Characteristics Power Requirements Digital Inputs and Outputs Timing Characteristics Typical Performance Characteristics Pin Functions Block Diagram Timing Diagram SPI Timing Definitions Applications Information Typical Applications Package Description Typical Application Related Parts