Datasheet LTC2281 (Analog Devices) - 5
| 制造商 | Analog Devices |
| 描述 | Dual 10-Bit, 125Msps Low Power 3V ADC |
| 页数 / 页 | 24 / 5 — The. POWER REQUIREMENTS. denotes the specifi cations which apply over the … |
| 文件格式/大小 | PDF / 500 Kb |
| 文件语言 | 英语 |
The. POWER REQUIREMENTS. denotes the specifi cations which apply over the full operating temperature
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LTC2281
The POWER REQUIREMENTS
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 8) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VDD Analog Supply Voltage (Note 9) ● 2.85 3 3.4 V OVDD Output Supply Voltage (Note 9) ● 0.5 3 3.6 V IVDD Supply Current Both ADCs at fS(MAX) ● 263 305 mA PDISS Power Dissipation Both ADCs at fS(MAX) ● 790 915 mW PSHDN Shutdown Power (Each Channel) SHDN = H, OE = H, No CLK 2 mW PNAP Nap Mode Power (Each Channel) SHDN = H, OE = L, No CLK 15 mW
The TIMING CHARACTERISTICS
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fs Sampling Frequency (Note 9) ● 1 125 MHz tL CLK Low Time Duty Cycle Stabilizer Off (Note 7) ● 3.8 4 500 ns Duty Cycle Stabilizer On (Note 7) ● 3 4 500 ns tH CLK High Time Duty Cycle Stabilizer Off (Note 7) ● 3.8 4 500 ns Duty Cycle Stabilizer On (Note 7) ● 3 4 500 ns tAP Sample-and-Hold Aperture Delay 0 ns tD CLK to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns tC CLK to CLKOUT Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns DATA to CLKOUT Skew (tD – tC) (Note 7) ● –0.6 0 0.6 ns tMD MUX to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns Data Access Time After OE↓ CL = 5pF (Note 7) ● 4.3 10 ns BUS Relinquish Time (Note 7) ● 3.3 8.5 ns Pipeline Latency 5 Cycles
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 5:
Integral nonlinearity is defi ned as the deviation of a code from a may cause permanent damage to the device. Exposure to any Absolute straight line passing through the actual endpoints of the transfer curve. Maximum Rating condition for extended periods may affect device The deviation is measured from the center of the quantization band. reliability and lifetime.
Note 6:
Offset error is the offset voltage measured from –0.5 LSB when
Note 2:
All voltage values are with respect to ground with GND and OGND the output code fl ickers between 00 0000 0000 and 11 1111 1111. wired together (unless otherwise noted).
Note 7:
Guaranteed by design, not subject to test.
Note 3:
When these pin voltages are taken below GND or above VDD, they
Note 8:
VDD = 3V, fSAMPLE = 125MHz, input range = 1VP-P with differential will be clamped by internal diodes. This product can handle input currents drive. The supply current and power dissipation are the sum total for both of greater than 100mA below GND or above VDD without latchup. channels with both channels active.
Note 4:
VDD = 3V, fSAMPLE = 125MHz, input range = 2VP-P with differential
Note 9:
Recommended operating conditions. drive, unless otherwise noted. 2281fb 5
The POWER REQUIREMENTS
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 8) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VDD Analog Supply Voltage (Note 9) ● 2.85 3 3.4 V OVDD Output Supply Voltage (Note 9) ● 0.5 3 3.6 V IVDD Supply Current Both ADCs at fS(MAX) ● 263 305 mA PDISS Power Dissipation Both ADCs at fS(MAX) ● 790 915 mW PSHDN Shutdown Power (Each Channel) SHDN = H, OE = H, No CLK 2 mW PNAP Nap Mode Power (Each Channel) SHDN = H, OE = L, No CLK 15 mW
The TIMING CHARACTERISTICS
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fs Sampling Frequency (Note 9) ● 1 125 MHz tL CLK Low Time Duty Cycle Stabilizer Off (Note 7) ● 3.8 4 500 ns Duty Cycle Stabilizer On (Note 7) ● 3 4 500 ns tH CLK High Time Duty Cycle Stabilizer Off (Note 7) ● 3.8 4 500 ns Duty Cycle Stabilizer On (Note 7) ● 3 4 500 ns tAP Sample-and-Hold Aperture Delay 0 ns tD CLK to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns tC CLK to CLKOUT Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns DATA to CLKOUT Skew (tD – tC) (Note 7) ● –0.6 0 0.6 ns tMD MUX to DATA Delay CL = 5pF (Note 7) ● 1.4 2.7 5.4 ns Data Access Time After OE↓ CL = 5pF (Note 7) ● 4.3 10 ns BUS Relinquish Time (Note 7) ● 3.3 8.5 ns Pipeline Latency 5 Cycles
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 5:
Integral nonlinearity is defi ned as the deviation of a code from a may cause permanent damage to the device. Exposure to any Absolute straight line passing through the actual endpoints of the transfer curve. Maximum Rating condition for extended periods may affect device The deviation is measured from the center of the quantization band. reliability and lifetime.
Note 6:
Offset error is the offset voltage measured from –0.5 LSB when
Note 2:
All voltage values are with respect to ground with GND and OGND the output code fl ickers between 00 0000 0000 and 11 1111 1111. wired together (unless otherwise noted).
Note 7:
Guaranteed by design, not subject to test.
Note 3:
When these pin voltages are taken below GND or above VDD, they
Note 8:
VDD = 3V, fSAMPLE = 125MHz, input range = 1VP-P with differential will be clamped by internal diodes. This product can handle input currents drive. The supply current and power dissipation are the sum total for both of greater than 100mA below GND or above VDD without latchup. channels with both channels active.
Note 4:
VDD = 3V, fSAMPLE = 125MHz, input range = 2VP-P with differential
Note 9:
Recommended operating conditions. drive, unless otherwise noted. 2281fb 5