Datasheet ADIS16201 (Analog Devices) - 5

制造商Analog Devices
描述Programmable Dual-Axis Inclinometer/Accelerometer
页数 / 页33 / 5 — ADIS16201. Data Sheet. Parameter. Conditions. Min. Typ. Max. Unit
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ADIS16201. Data Sheet. Parameter. Conditions. Min. Typ. Max. Unit

ADIS16201 Data Sheet Parameter Conditions Min Typ Max Unit

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ADIS16201 Data Sheet Parameter Conditions Min Typ Max Unit
DAC OUTPUT 5 kΩ/100 pF to GND Resolution 12 Bits Relative Accuracy For Code 101 to Code 4095 4 LSB Differential Nonlinearity 1 LSB Offset Error ±5 mV Gain Error ±0.5 % Output Range 0 to 2.5 V Output Impedance 2 Ω Output Settling Time 10 µs LOGIC INPUTS Input High Voltage, VINH 2.0 V Input Low Voltage, VINL 0.8 V Logic 1 Input Current, IINH VIH = VDD ±0.2 ±1 µA Logic 0 Input Current, IINL VIL = 0 V −40 −60 μA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V SLEEP TIMER Timeout Period3 0.5 128 Seconds FLASH MEMORY Endurance4 20,000 Cycles Data Retention5 TJ = 85°C 20 Years CONVERSION RATE Minimum Conversion Time 244 μs Maximum Conversion Time 484 ms Maximum Throughput Rate 4096 SPS Minimum Throughput Rate 2.066 SPS POWER SUPPLY Operating Voltage Range VDD 3.0 3.3 3.6 V Power Supply Current Normal mode, SMPL_TIME ≥ 11 14 mA 0x08 (fs ≤ 910 Hz), at 25°C Fast mode, SMPL_TIME ≤ 0x07 36 42 (f mA s ≥ 1024 Hz), at 25°C Sleep mode, at 25°C 500 750 µA Turn-On Time6 130 ms 1 Guaranteed by iMEMs packaged part testing, design, and/or characterization. 2 Self-test response changes as the square of VDD. 3 Guaranteed by design. 4 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C. 5 Retention lifetime equivalent at junction temperature (TJ) 85°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature. 6 The start-up time defines the time from VDD > 3.0 V to the first output register update. This parameter does not account for filter settling, which depends on the SMPL_PRD and AVG_CNT settings. Rev. C | Page 4 of 32 Document Outline Features Applications Functional Block Diagram General Description Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Accelerometer Operation Inclinometer Operation Temperature Sensor Basic Operation Data Output Register Access Programming and Control Control Register Overview Control Register Access Control Register Details Calibration Calibration Register Definitions XACCL_OFF Register Definition XACCL_SCALE Register Definition YACCL_OFF Register Definition YACCL_SCALE Register Definition XINCL_OFF Register Definition XINCL_SCALE Register Definition YINCL_OFF Register Definition YINCL_SCALE Register Definition Alarms ALM_MAG1 Register Definition ALM_SMPL1 Register Definition ALM_MAG2 Register Definition ALM_SMPL2 Register Definition ALM_CTRL Register Definition Sample Period Control SMPL_PRD Register Definition Filtering Control AVG_CNT Register Definition Power-Down Control PWR_MDE Register Definition Status Feedback STATUS Register Definition Command Control COMMAND Register Definition Miscellaneous Control Register MSC_CTRL Register Definition Peripherals Auxiliary ADC Function Auxiliary DAC Function AUX_DAC Register Definition General Purpose I/O Control GPIO_CTRL Register Definition Applications Serial Peripheral Interface (SPI) Hardware Considerations Grounding and Board Layout Recomendations Bandgap Reference Power-On Reset Operation Second-Level Assembly Example Pad Layout Outline Dimensions Ordering Guide