Datasheet ADIS16497 (Analog Devices) - 5

link to page 31 link to page 31 link to page 31 link to page 31
ADIS16497 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit
Noise Output Noise No filtering 2.6 mg rms Noise Density 10 Hz to 40 Hz, no filtering 88 μg/√Hz rms −3 dB Bandwidth 750 Hz Sensor Resonant Frequency 5.5 kHz TEMPERATURE SENSOR Scale Factor Output = 0x0000 at 25°C (±5°C) 0.0125 °C/LSB LOGIC INPUTS5 Input Voltage High, VIH 2.0 V Low, VIL 0.8 V RST Pulse Width 1 µs CS Wake-Up Pulse Width 20 µs Input Current Logic 1, IIH VIH = 3.3 V 10 µA Logic 0, IIL VIL = 0 V All Pins Except RST, CS 10 µA RST, CS Pins6 0.33 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS5 Output Voltage High, VOH ISOURCE = 0.5 mA 2.4 V Low, VOL ISINK = 2.0 mA 0.4 V FLASH MEMORY Endurance7 100,000 Cycles Data Retention8 TJ = 85°C 20 Years FUNCTIONAL TIMES9 Time until data is available Power-On Start-Up Time 250 ms Reset Recovery Time10 GLOB_CMD, Bit 7 = 1 (see Table 142) 210 ms RST pulled low, then restored to high 250 ms Flash Memory Update Time GLOB_CMD, Bit 3 = 1 (see Table 142) 1120 ms Clear User Calibration GLOB_CMD, Bit 6 = 1 (see Table 142) 350 µs Self Test Time11 GLOB_CMD, Bit 1 = 1 (see Table 142) 20 ms CONVERSION RATE 4.25 kSPS Initial Clock Accuracy 0.02 % Temperature Coefficient 40 ppm/°C Sync Input Clock 3.0 4.5 kHz Pulse Per Second (PPS) Mode 1 128 Hz POWER SUPPLY, VDD Operating voltage range 3.0 3.6 V Power Supply Current12 Normal mode, VDD = 3.3 V, µ + σ 89 mA 1 FS = ful scale, FS = 125°/sec (ADIS16495-1BMLZ), FS = 450°/sec (ADIS16495-2BMLZ), FS = 2000°/sec (ADIS16495-3BMLZ). 2 Bias repeatability provides an estimate for long-term drift in the bias, as observed during 500 hours of high temperature operating life (HTOL) at +105C. 3 Magnitude between 10 and 40 Hz, sample rate is 4250 SPS (nominal), no digital filtering. 4 All specifications associated with the accelerometers relate to the ful -scale range of ±5 g. 5 The digital I/O signals use a 3.3 V system. 6 RST and CS pins are connected to the VDD pin through 10kΩ pull-up resistors. 7 Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C. 8 The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ. 9 These times do not include thermal settling and internal filter response times, which can affect overal accuracy. 10 The RST line must be in a low state for at least 10 μs to ensure a proper reset initiation and recovery. 11 Self test time can extend when using external clock rates that are lower than 4000 Hz. 12 Supply current transients can reach 250 mA during initial startup or reset recovery. Rev. A | Page 4 of 39 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Register Specific Stall Times Timing Diagrams ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INERTIAL SENSOR SIGNAL CHAIN Gyroscope Data Sampling Accelerometer Data Sampling External Clock Options Inertial Sensor Calibration Gyroscope Factory Calibration Accelerometer Factory Calibration Filtering REGISTER STRUCTURE SERIAL PERIPHERAL INTERFACE DATA READY READING SENSOR DATA Burst Read Function DEVICE CONFIGURATION Dual Memory Structure USER REGISTER MEMORY MAP USER REGISTER DEFINTIONS PAGE NUMBER (PAGE_ID) DATA/SAMPLE COUNTER (DATA_CNT) STATUS/ERROR FLAG INDICATORS (SYS_E_FLAG) SELF TEST ERROR FLAGS (DIAG_STS) INTERNAL TEMPERATURE (TEMP_OUT) GYROSCOPE DATA Gyroscope Measurement Range/Scale Factor Gyroscope Data Formatting X-Axis Gyroscope (X_GYRO_LOW, X_GRYO_OUT) Y-Axis Gyroscope (Y_GYRO_LOW, Y_GYRO_OUT) Z-Axis Gyroscope (Z_GYRO_LOW, Z_GYRO_OUT) ACCELERATION DATA X-Axis Accelerometer (X_ACCL_LOW, X_ACCL_OUT) Y-Axis Accelerometer (Y_ACCL_LOW, Y_ACCL_OUT) Z-Axis Accelerometer (Z_ACCL_LOW, Z_ACCL_OUT) Accelerometer Resolution TIME STAMP CYCLICAL REDUNDANDCY CHECK (CRC-32) DELTA ANGLES Delta Angle Measurement Range X-Axis Delta Angle (X_DELTANG_LOW, X_DELTANG_OUT) Y-Axis Delta Angle (Y_DELTANG_LOW, Y_DELTANG_OUT) Z-Axis Delta Angle (Z_DELTANG_LOW, Z_DELTANG_OUT) Delta Angle Resolution DELTA VELOCITY X-Axis Delta Velocity (X_DELTVEL_LOW, X_DELTVEL_OUT) Y-Axis Delta Velocity (Y_DELTVEL_LOW, Y_DELTVEL_OUT) Z-Axis Delta Velocity (Z_DELTVEL_LOW, Z_DELTVEL_OUT) Delta Velocity Resolution Burst Read Command, BURST_CMD Product Identification, PROD_ID USER BIAS/SCALE ADJUSTMENT Gyroscope Scale Adjustment, X_GYRO_SCALE Gyroscope Scale Adjustment, Y_GYRO_SCALE Gyroscope Scale Adjustment, Z_GYRO_SCALE Accelerometer Scale Adjustment, X_ACCL_SCALE Accelerometer Scale Adjustment, Y_ACCL_SCALE Accelerometer Scale Adjustment, Z_ACCL_SCALE Gyroscope Bias Adjustment, XG_BIAS_LOW, XG_BIAS_HIGH Gyroscope Bias Adjustment, YG_BIAS_LOW, YG_BIAS_HIGH Gyroscope Bias Adjustment, ZG_BIAS_LOW, ZG_BIAS_HIGH Accelerometer Bias Adjustment, XA_BIAS_LOW, XA_BIAS_HIGH Accelerometer Bias Adjustment, YA_BIAS_LOW, YA_BIAS_HIGH Accelerometer Bias Adjustment, ZA_BIAS_LOW, ZA_BIAS_HIGH SCRATCH REGISTERS, USER_SCR_X FLASH MEMORY ENDURANCE COUNTER, FLSHCNT_LOW, FLSHCNT_HIGH GLOBAL COMMANDS, GLOB_CMD Software Reset Clear User Calibration Flash Memory Update On Demand Self Test (ODST) Bias Correction Update AUXILIARY I/O LINE CONFIGURATION, FNCTIO_CTRL Data Ready Indicator Input Sync/Clock Control GENERAL-PURPOSE I/O CONTROL, GPIO_CTRL MISCELLANEOUS CONFIGURATION, CONFIG Point of Percussion LINEAR ACCELERATION ON EFFECT ON GYROSCOPE BIAS DECIMATION FILTER, DEC_RATE CONTINUOUS BIAS ESTIMATION (CBE), NULL_CNFG SCALING THE INPUT CLOCK (PPS MODE), SYNC_SCALE Measurement Range Identifier, RANG_MDL FIR FILTERS FIR Filters Control, FILTR_BNK_0, FILTR_BNK_1 FIR Filter Bank Memory Maps FIR Filter Bank A, FIR_COEF_A000 to FIR_COEF_A119 FIR Filter Bank B, FIR_COEF_B000 to FIR_COEF_B119 FIR Filter Bank C, FIR_COEF_C000 to FIR_COEF_C119 FIR Filter Bank D, FIR_COEF_D000 to FIR_COEF_D119 Default Filter Performance FIRMWARE REVISION, FIRM_REV FIRMWARE REVISION YEAR, FIRM_Y BOOT REVISION NUMBER, BOOT_REV CONTINUOUS SRAM TESTING Signature CRC, Calibration Values, CAL_SIGTR_LWR Signature CRC, Calibration Values, CAL_SIGTR_UPR Derived CRC, Calibration Values, CAL_DRVTN_LWR Derived CRC, Calibration Values, CAL_DRVTN_UPR Signature CRC, Program Code, CODE_SIGTR_LWR Signature CRC, Program Code, CODE_SIGTR_UPR Derived CRC, Program Code, CODE_DRVTN_LWR Derived CRC, Program Code, CODE_DRVTN_UPR Lot Specific Serial Number, SERIAL_NUM APPLICATIONS INFORMATION MOUNTING BEST PRACTICES PREVENTING MISINSERTION EVALUATION TOOLS Breakout Board, ADIS16IMU1/PCBZ PC-Based Evaluation, EVAL-ADIS2 POWER SUPPLY CONSIDERATIONS OUTLINE DIMENSIONS ORDERING GUIDE