Datasheet ADIS16460 (Analog Devices) - 5

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ADIS16460 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit
Logic 0 Input Current, IIL VIL = 0 V All Pins Except RST 40 60 µA RST Pin 1 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS5 Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V FLASH MEMORY Endurance6 10,000 Cycles Data Retention7 TJ = 85°C 20 Years FUNCTIONAL TIMES8 Time until new data is available Power-On Start-Up Time 290 ms Reset Recovery Time9, 10 222 ms Reset Initiation Time11 10 μs CONVERSION RATE x_GYRO_OUT, x_ACCL_OUT 2048 SPS Clock Accuracy ±3 % Sync Input Clock12 MSC_CTRL[3:2] = 01 0.8 2000 Hz PPS Input Clock MSC_CTRL[3:2] = 10 128 Hz POWER SUPPLY Operating voltage range, VDD 3.15 3.3 3.45 V Power Supply Current VDD = 3.15 V 44 55 mA 1 The X_GYRO_LOW (see Table 10), Y_GYRO_LOW (see Table 12), and Z_GYRO_LOW (see Table 14) registers capture the bit growth associated with the user configurable filters. 2 The repeatability specifications represent analytical projections, which are based on the following drift contributions and conditions: temperature hysteresis (0°C to 70°C), electronics drift (high temperature operating life test: 85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −40°C to +85°C), rate random walk (10 year projection), and broadband noise. 3 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications. 4 The X_ACCL_LOW (see Table 24), Y_ACCL_LOW (see Table 26), and Z_ACCL_LOW (see Table 28) registers capture the bit growth associated with the user configurable filters. 5 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 6 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C. 7 The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction temperature. 8 These times do not include thermal settling and internal filter response times (375 Hz bandwidth), which may affect overal accuracy. 9 The parameter assumes that a ful start-up sequence has taken place, prior to initiation of the reset cycle. 10 This parameter represents the time between raising the RST line and restoration of pulsing on the DR line, which indicates a return to normal operation. 11 This parameter represents the pulse time on the RST line, which ensures initiation of the reset operation. 12 The sync input clock functions below the specified minimum value but at reduced performance levels. Rev. B | Page 4 of 26 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION READING SENSOR DATA Burst Read Function SPI Read Test Sequence DEVICE CONFIGURATION Dual Memory Structure USER REGISTERS OUTPUT DATA REGISTERS ROTATION Angular Rate Data Delta Angle Data ACCELEROMETERS Linear Acceleration Delta Velocity Data INTERNAL TEMPERATURE PRODUCT IDENTIFICATION STATUS/ERROR FLAGS Manual Flash Update SPI Communication Failure Sensor Overrange Self Test Failure Flash Test Failure Input Clock Sync Failure SYSTEM FUNCTIONS GLOBAL COMMANDS SOFTWARE RESET FLASH MEMORY TEST MANUAL FLASH UPDATE AUTOMATED SELF TEST INPUT/OUTPUT CONFIGURATION DATA READY (DR) PIN CONFIGURATION SYNC PIN CONFIGURATION Sample Time Indicator Precision Input Sync with Data Counter Direct Sample Control DIGITAL PROCESSING CONFIGURATION GYROSCOPES/ACCELEROMETERS Digital Filtering CALIBRATION GYROSCOPES Gyroscope Bias Error Estimation Gyroscope Bias Correction Factors Single Command Bias Correction ACCELEROMETERS Accelerometer Bias Error Estimation Accelerometer Bias Correction Factors Point of Percussion Alignment RESTORING FACTORY CALIBRATION APPLICATIONS INFORMATION MOUNTING TIPS POWER SUPPLY CONSIDERATIONS BREAKOUT BOARD PC-BASED EVALUATION TOOLS Estimating the Number of Relevant Bits OUTLINE DIMENSIONS ORDERING GUIDE