Datasheet ADIS16445 (Analog Devices) - 5

ADIS16445 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit
DIGITAL OUTPUTS3 Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V FLASH MEMORY Endurance4 10,000 Cycles Data Retention5 TJ = 85°C 20 Years FUNCTIONAL TIMES6 Time until new data is available Power-On Start-Up Time 175 ms Reset Recovery Time7 55 ms Flash Memory Back-Up Time 55 ms Flash Memory Test Time 20 ms Automatic Self-Test Time SMPL_PRD = 0x0001 16 ms CONVERSION RATE xGYRO_OUT, xACCL_OUT SMPL_PRD = 0x0001 819.2 SPS Clock Accuracy ±3 % Sync Input Clock8 0.8 1.1 kHz POWER SUPPLY Operating voltage range, VDD 3.15 3.3 3.45 V Power Supply Current VDD = 3.15 V 74 mA 1 The repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C to +85°C), electronics drift (high-temperature operating life test: 85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −40°C to +85°C), rate random walk (10 year projection), and broadband noise. 2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications. 3 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 4 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C. 5 The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction temperature. 6 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overal accuracy. 7 The RST line must be held low for at least 10 μs to assure a proper reset and recovery sequence. 8 The sync input clock functions below the specified minimum value but at reduced performance levels. Rev. F | Page 4 of 22 Document Outline Features Applications General Description Functional Block Diagram Table of Contents Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics User Registers User Interface Reading Sensor Data Burst Read Function SPI Read Test Sequence Device Configuration Dual Memory Structure Output Data Registers Gyroscopes Accelerometers Internal Temperature System Functions Global Commands Product Identification Self-Test Function Status/Error Flags Memory Management Checksum Test Input/Output Configuration Data Ready Indicator General-Purpose Input/Output Example Input/Output Configuration Digital Processing Configuration Gyroscopes/Accelerometers Input Clock Configuration Digital Filtering Dynamic Range Calibration Gyroscopes Gyroscope Bias Error Estimation Gyroscope Bias Correction Factors Single Command Bias Correction Accelerometers Accelerometer Bias Error Estimation Accelerometer Bias Correction Factors Point of Percussion Alignment Flash Updates Restoring Factory Calibration Alarms Static Alarm Use Dynamic Alarm Use Alarm Reporting Alarm Example Applications Information Mounting Tips Power Supply Considerations ADIS16445/PCBZ Installation PC-Based Evaluation Tools Outline Dimensions Ordering Guide