Datasheet AD810 (Analog Devices) - 7

TABLE I. Electrical performance characteristics – Continued. Conditions Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits 1/ Unit R subgroups type L = 150 Ω unless otherwise specified Min Max Slew rate 3/ SR V 4 01 500 V/µs S = ±15 V, RL = 400 Ω, AV = -10, TA = +25°C, measured at 10% to 90% points, rising and falling edge V 175 S = ±5 V, RL = 150 Ω, AV = -10, TA = +25°C, measured at 10% to 90% points, rising and falling edge Differential gain 3/ DG 4 01 0.05 % VS = ±15 V, f = 3.58 MHz, TA = +25°C 0.07 VS = ±5 V, f = 3.58 MHz, TA = +25°C Differential phase 3/ DP 4 01 0.07 Degree VS = ±15 V, f = 3.58 MHz, TA = +25°C 0.08 VS = ±5 V, f = 3.58 MHz, TA = +25°C 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ The voltage swing test is defined as useful operating range, but no saturation range. 3/ If not tested, shall be guaranteed to the limits specified in table I herein.
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5962-93132 MICROCIRCUIT DRAWING A
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