Datasheet RH3083MK DICE/DWF (Analog Devices) - 5
| 制造商 | Analog Devices |
| 描述 | Adjustable 2.8A Single Resistor Low Dropout Regulator |
| 页数 / 页 | 6 / 5 — table 4. electrical test requireMents MIL-STD-883 TEST REQUIREMENTS. … |
| 文件格式/大小 | PDF / 249 Kb |
| 文件语言 | 英语 |
table 4. electrical test requireMents MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. PDA Test Notes. total Dose bias circuit
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RH3083MK DICE/DWF
table 4. electrical test requireMents MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from Group A, Subgroup 1, Final Electrical Test Requirements (Method 5004) 1*, 2, 3 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1, 2, 3 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1, after Group B and D for Class S, 1, 2, 3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
total Dose bias circuit
4 CASE 3V IN OUT 1µF 3 1 10µF 100Ω VCONTROL NC SET 2 10k
burn-in circuit
4 CASE 40V IN OUT 1µF 3 1 10µF 499Ω VCONTROL NC SET 2 10k rh3083mkfa Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. 5 Document Outline Features Description Dice Pinout Absolute Maximum Ratings Table 1. DICE/DWF Electrical Test Limits Table 2. Electrical Characteristics Table 3. Electrical Characteristics Table 4. Electrical Test Requirements Total Dose Bias Circuit Burn-In Circuit Typical Performance Characteristics Revision History
table 4. electrical test requireMents MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from Group A, Subgroup 1, Final Electrical Test Requirements (Method 5004) 1*, 2, 3 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1, 2, 3 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1, after Group B and D for Class S, 1, 2, 3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
total Dose bias circuit
4 CASE 3V IN OUT 1µF 3 1 10µF 100Ω VCONTROL NC SET 2 10k
burn-in circuit
4 CASE 40V IN OUT 1µF 3 1 10µF 499Ω VCONTROL NC SET 2 10k rh3083mkfa Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. 5 Document Outline Features Description Dice Pinout Absolute Maximum Ratings Table 1. DICE/DWF Electrical Test Limits Table 2. Electrical Characteristics Table 3. Electrical Characteristics Table 4. Electrical Test Requirements Total Dose Bias Circuit Burn-In Circuit Typical Performance Characteristics Revision History