Datasheet LTZ1000, LTZ1000A (Analog Devices) - 2

LTZ1000/LTZ1000A
absoluTe MaxiMuM raTings pin conFiguraTion (Note 1)
Heater to Substrate ...35V BOTTOM VIEW Collector Emitter Breakdown Q1 ...15V 8 Collector Emitter Breakdown Q2 ...35V 7 1 Emitter Base Reverse Bias ..2V Q2 Operating Temperature Range ...–55°C ≤ TA ≤ 125°C 6 2 Storage Temperature Range ..–65°C ≤ TA ≤ 150°C Q1 Substrate Forward Bias .. 0.1V 7V 5 3 4 H8 PACKAGE TO-5 METAL CAN TJMAX = 150°C, LTZ1000CH: θJA = 80°C/W LTZ1000ACH: θJA = 400°C/W
orDer inForMaTion LEAD FREE FINISH PART MARKING PACKAGE DESCRIPTION SPECIFIED TEMPERATURE RANGE
LTZ1000ACH#PBF LTZ1000ACH 8-Lead TO-5 Metal Can (.200 Inch PCD) –55°C to 125°C LTZ1000CH#PBF LTZ1000CH 8-Lead TO-5 Metal Can (.200 Inch PCD) –55°C to 125°C
LEAD BASED FINISH PART MARKING PACKAGE DESCRIPTION SPECIFIED TEMPERATURE RANGE
LTZ1000ACH LTZ1000ACH 8-Lead TO-5 Metal Can (.200 Inch PCD) –55°C to 125°C LTZ1000CH LTZ1000CH 8-Lead TO-5 Metal Can (.200 Inch PCD) –55°C to 125°C Consult LTC Marketing for parts specified with wider operating temperature ranges. For more information on lead free part marking, go to: http://www.linear.com/leadfree/ This product is only offered in trays. For more information go to: http://www.linear.com/packaging/
elecTrical characTerisTics (Note 2) PARAMETER CONDITIONS MIN TYP MAX UNITS
Zener Voltage lZ = 5mA, (VZ + VBEQ1) IQ1 = 100µA 7.0 7.2 7.5 V lZ = 1mA, (VZ + VBEQ1) IQ1 = 100µA 6.9 7.15 7.45 V Zener Change with Current 1mA ≤ IZ < 5mA 80 240 mV Zener Leakage Current VZ = 5V 20 200 µA Zener Noise lZ = 5mA, 0.1Hz < f < 10Hz 1.2 2 µVP-P 1Q1 = 100µA Heater Resistance IL ≤ 100µA 200 300 420 Ω Heater Breakdown Voltage 35 V Transistor Q1 Breakdown IC = 10µA, LVCEO 15 20 V Transistor Q2 Breakdown IC = 10µA, LVCEO 35 50 V Q1, Q2 Current Gain IC = 100µA 80 200 450 Thermal Resistance LTZ1000 Time = 5 Minutes 80 °C/W LTZ1000A Time = 5 Minutes 400 °C/W Long-Term Stability T = 65°C 2 µV√kHr
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 2:
All testing is done at 25°C. Pulse testing is used for LTZ1000A to may cause permanent damage to the device. Exposure to any Absolute minimize temperature rise during testing. LTZ1000 and LTZ1000A devices Maximum Rating condition for extended periods may affect device are QA tested at –55°C and 125°C. reliability and lifetime. 1000afe 2 For more information www.linear.com/LTZ1000 Document Outline Features Applications Description Typical Application Absolute Maximum Ratings Pin Configuration Order Information Electrical Characteristics Typical Performance Characteristics Pin Functions Block Diagram Applications Information Typical Applications Revision History Package Description Related Parts