Datasheet RH1034-1.2 (Analog Devices) - 3
| 制造商 | Analog Devices |
| 描述 | Micropower Dual Reference |
| 页数 / 页 | 4 / 3 — TABLE 3: POST BURN-IN ENDPOINTS AND DELTA LIMITS REQUIREMENTS TA = 25°C. … |
| 文件格式/大小 | PDF / 79 Kb |
| 文件语言 | 英语 |
TABLE 3: POST BURN-IN ENDPOINTS AND DELTA LIMITS REQUIREMENTS TA = 25°C. ENDPOINTS LIMITS. DELTA LIMITS. SYMBOL PARAMETER
该数据表的模型线
文件文字版本
RH1034-1.2
TABLE 3: POST BURN-IN ENDPOINTS AND DELTA LIMITS REQUIREMENTS TA = 25°C ENDPOINTS LIMITS DELTA LIMITS SYMBOL PARAMETER CONDITIONS MIN MAX MIN MAX UNITS
VZ Reverse Breakdown Voltage IR = 100μA 1.210 1.240 –0.003 0.003 V
TABLE 4: ELECTRICAL TEST REQUIREMENTS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specifi ed as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3 tests after cooldown as the fi nal electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3 5004 of MIL-STD-883. The verifi ed failures of group A, subgroup 1, after Group B and D for Class S, 1,2,3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
20V 14k 19.1k 7V 1.2V RH10341.2 BC Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. 3
TABLE 3: POST BURN-IN ENDPOINTS AND DELTA LIMITS REQUIREMENTS TA = 25°C ENDPOINTS LIMITS DELTA LIMITS SYMBOL PARAMETER CONDITIONS MIN MAX MIN MAX UNITS
VZ Reverse Breakdown Voltage IR = 100μA 1.210 1.240 –0.003 0.003 V
TABLE 4: ELECTRICAL TEST REQUIREMENTS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specifi ed as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3 tests after cooldown as the fi nal electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3 5004 of MIL-STD-883. The verifi ed failures of group A, subgroup 1, after Group B and D for Class S, 1,2,3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
20V 14k 19.1k 7V 1.2V RH10341.2 BC Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. 3