Datasheet ADL5304 (Analog Devices) - 7
| 制造商 | Analog Devices |
| 描述 | High Speed, 200 dB Range, Current to Voltage Logarithmic Converter |
| 页数 / 页 | 32 / 7 — Data Sheet. ADL5304. TYPICAL PERFORMANCE CHARACTERISTICS. 3.0. +85°C … |
| 修订版 | A |
| 文件格式/大小 | PDF / 924 Kb |
| 文件语言 | 英语 |
Data Sheet. ADL5304. TYPICAL PERFORMANCE CHARACTERISTICS. 3.0. +85°C +70°C. 2.5. +25°C. 0°C –40°C. 2.0. (V) T PU. ; 10mV. 1.5. B) d. O G. R (
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Data Sheet ADL5304 TYPICAL PERFORMANCE CHARACTERISTICS
VPOS = 5 V, VNEG = 0 V, TA = 25°C; IDEN = IREF; VSM1 to VSM4, 1P5V, DCBI, and INPS tied together; SCL1 = VLOG; SCL2 = INMS; SCL3 = open; scale = 200 mV/dec; VLOG output load RL > 2 kΩ, unless otherwise noted.
3.0 3 +85°C +70°C 2.5 +25°C 2 0°C –40°C B 2.0 /d 1 (V) T PU ; 10mV T 1.5 0 U B) d O G R ( LOV 1.0 –1 RRO E +85°C +70°C 0.5 –2 +25°C 0°C –40°C 0 –3
003
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m
006
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m I I NUM CURRENT (A)
09459-
NUM CURRENT (A)
09459- Figure 3. VLOG vs. INUM for Multiple Temperatures Figure 6. Law Conformance Error vs. INUM for Multiple Temperatures; Normalized to 25°C
3.0 3 +85°C +70°C 2.5 +25°C 2 0°C –40°C B 2.0 /d 1 (V) T PU ; 10mV T 1.5 0 U B) d O G R ( LOV 1.0 –1 RRO E +85°C +70°C +25°C 0.5 –2 0°C –40°C 0 –3
007 004
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m 1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m I I DEN CURRENT (A) DEN CURRENT (A)
09459- 09459- Figure 4. V Figure 7. Law Conformance Error vs. I LOG vs. IDEN for Multiple Temperatures; INUM = 100 nA DEN for Multiple Temperatures; INUM = 100 nA; Normalized to 25°C
3.5 3 100pA 1mA 1nA 100µA 3.0 10nA 10µA 2 100nA 1µA 1µA 100nA 10nA 2.5 10µA B /d 1 100µA 1nA (V) 1mA 100pA T 2.0 PU ; 10mV T 0 B) U d O 1.5 G R ( LO –1 V RRO 1.0 E –2 0.5 –3 0
008 005
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m 1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m I I NUM CURRENT (A)
09459-
NUM CURRENT (A)
09459- Figure 5. V Figure 8. Law Conformance Error vs. INUM for Multiple Values of IDEN LOG vs. INUM for Multiple Values of IDEN (Decade Steps from 100 pA to 1 mA) (Decade Steps from 100 pA to 1 mA) Rev. A | Page 7 of 32 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION SIMPLIFIED BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TEST CIRCUITS TERMINOLOGY THEORY OF OPERATION BASIC CONCEPTS OPTICAL MEASUREMENTS Decibel Scaling CIRCUIT DESCRIPTION Bandwidth vs. Current Noise vs. Current Filtering to Improve Noise and Dynamic Behavior Photodiode Bias Reference Outputs Buffer Amplifier Setting the Log Slope and Intercept Slope Inversion Log Ratio Operation APPLICATIONS INFORMATION USING THE ADL5304 Using the Adaptive Bias Summing Node Voltage Leakage VLOG Output Dynamic Response USING A NEGATIVE SUPPLY EVALUATION BOARD SCHEMATIC AND SILKSCREENS OUTLINE DIMENSIONS ORDERING GUIDE
VPOS = 5 V, VNEG = 0 V, TA = 25°C; IDEN = IREF; VSM1 to VSM4, 1P5V, DCBI, and INPS tied together; SCL1 = VLOG; SCL2 = INMS; SCL3 = open; scale = 200 mV/dec; VLOG output load RL > 2 kΩ, unless otherwise noted.
3.0 3 +85°C +70°C 2.5 +25°C 2 0°C –40°C B 2.0 /d 1 (V) T PU ; 10mV T 1.5 0 U B) d O G R ( LOV 1.0 –1 RRO E +85°C +70°C 0.5 –2 +25°C 0°C –40°C 0 –3
003
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m
006
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m I I NUM CURRENT (A)
09459-
NUM CURRENT (A)
09459- Figure 3. VLOG vs. INUM for Multiple Temperatures Figure 6. Law Conformance Error vs. INUM for Multiple Temperatures; Normalized to 25°C
3.0 3 +85°C +70°C 2.5 +25°C 2 0°C –40°C B 2.0 /d 1 (V) T PU ; 10mV T 1.5 0 U B) d O G R ( LOV 1.0 –1 RRO E +85°C +70°C +25°C 0.5 –2 0°C –40°C 0 –3
007 004
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m 1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m I I DEN CURRENT (A) DEN CURRENT (A)
09459- 09459- Figure 4. V Figure 7. Law Conformance Error vs. I LOG vs. IDEN for Multiple Temperatures; INUM = 100 nA DEN for Multiple Temperatures; INUM = 100 nA; Normalized to 25°C
3.5 3 100pA 1mA 1nA 100µA 3.0 10nA 10µA 2 100nA 1µA 1µA 100nA 10nA 2.5 10µA B /d 1 100µA 1nA (V) 1mA 100pA T 2.0 PU ; 10mV T 0 B) U d O 1.5 G R ( LO –1 V RRO 1.0 E –2 0.5 –3 0
008 005
1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m 1p 10p 100p 1n 10n 100n 1μ 10μ 100μ 1m 10m I I NUM CURRENT (A)
09459-
NUM CURRENT (A)
09459- Figure 5. V Figure 8. Law Conformance Error vs. INUM for Multiple Values of IDEN LOG vs. INUM for Multiple Values of IDEN (Decade Steps from 100 pA to 1 mA) (Decade Steps from 100 pA to 1 mA) Rev. A | Page 7 of 32 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION SIMPLIFIED BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TEST CIRCUITS TERMINOLOGY THEORY OF OPERATION BASIC CONCEPTS OPTICAL MEASUREMENTS Decibel Scaling CIRCUIT DESCRIPTION Bandwidth vs. Current Noise vs. Current Filtering to Improve Noise and Dynamic Behavior Photodiode Bias Reference Outputs Buffer Amplifier Setting the Log Slope and Intercept Slope Inversion Log Ratio Operation APPLICATIONS INFORMATION USING THE ADL5304 Using the Adaptive Bias Summing Node Voltage Leakage VLOG Output Dynamic Response USING A NEGATIVE SUPPLY EVALUATION BOARD SCHEMATIC AND SILKSCREENS OUTLINE DIMENSIONS ORDERING GUIDE