Datasheet RH1078M (Analog Devices) - 6
| 制造商 | Analog Devices |
| 描述 | Micropower, Dual, Single Supply Precision Op Amp |
| 页数 / 页 | 8 / 6 — TABLE 2: ELECTRICAL TEST REQUIREMENTS. MIL-STD-883 TEST REQUIREMENTS. … |
| 修订版 | G |
| 文件格式/大小 | PDF / 161 Kb |
| 文件语言 | 英语 |
TABLE 2: ELECTRICAL TEST REQUIREMENTS. MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. PDA Test Notes. TYPICAL APPLICATIONS
该数据表的模型线
文件文字版本
RH1078M
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, Group C and D End Point Electrical Parameters 1,2,3 after burn-in divided by the total number of devices submitted for burn-in in (Method 5005) that lot shall be used to determine the percent for the lot. *PDA Applies to subgroup 1. See PDA Test Notes. Analog Devices, Inc. reserves the right to test to tighter limits than those given.
TYPICAL APPLICATIONS Input Offset Voltage Input Offset Current Input Bias Current
1000 20 0 750 15 –20 500 10 –40 250 5 –60 0 0 –80 –250 –5 –100 –500 –10 –120 INPUT OFFSET VOLTAGE (µV) INPUT BIAS CURRENT (nA) INPUT OFFSET CURRENT (nA) –750 –15 –140 –1000 –20 –160 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) 1078M • G1 1078M • G2 1078M • G3
Common Mode Rejection Ratio Power Supply Rejection Ratio Large-Signal Voltage Gain
130 140 150 130 140 VS = ±15V 120 120 130 VO = ±10V RL = 2k 110 120 110 100 110 VS = 5V, 0V 90 100 VO = 0.03V TO 3.5V RL = 50k 100 80 90 70 LARGE-SIGNAL VOLTAGE GAIN (dB) 80 COMMON MODE REJECTION RATIO (dB) POWER SUPPLY REJECTION RATIO (dB) 90 60 70 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) 1078M • G4 1078M • G5 1078M • G6 Rev. G 6 For more information www.analog.com Document Outline Description Package/Order Information Burn-In Circuit Total Dose Bias Circuit Absolute Maximum Ratings Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Test Requirements Typical Applications Revision History
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, Group C and D End Point Electrical Parameters 1,2,3 after burn-in divided by the total number of devices submitted for burn-in in (Method 5005) that lot shall be used to determine the percent for the lot. *PDA Applies to subgroup 1. See PDA Test Notes. Analog Devices, Inc. reserves the right to test to tighter limits than those given.
TYPICAL APPLICATIONS Input Offset Voltage Input Offset Current Input Bias Current
1000 20 0 750 15 –20 500 10 –40 250 5 –60 0 0 –80 –250 –5 –100 –500 –10 –120 INPUT OFFSET VOLTAGE (µV) INPUT BIAS CURRENT (nA) INPUT OFFSET CURRENT (nA) –750 –15 –140 –1000 –20 –160 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) 1078M • G1 1078M • G2 1078M • G3
Common Mode Rejection Ratio Power Supply Rejection Ratio Large-Signal Voltage Gain
130 140 150 130 140 VS = ±15V 120 120 130 VO = ±10V RL = 2k 110 120 110 100 110 VS = 5V, 0V 90 100 VO = 0.03V TO 3.5V RL = 50k 100 80 90 70 LARGE-SIGNAL VOLTAGE GAIN (dB) 80 COMMON MODE REJECTION RATIO (dB) POWER SUPPLY REJECTION RATIO (dB) 90 60 70 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) TOTAL DOSE-KRADs (Si) 1078M • G4 1078M • G5 1078M • G6 Rev. G 6 For more information www.analog.com Document Outline Description Package/Order Information Burn-In Circuit Total Dose Bias Circuit Absolute Maximum Ratings Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Test Requirements Typical Applications Revision History