Datasheet RH119 (Analog Devices) - 3
| 制造商 | Analog Devices |
| 描述 | High Performance Dual Comparator |
| 页数 / 页 | 4 / 3 — ELECTRICAL CHARACTERISTICS (Continued). Note 1:. Note 3:. Note 2:. Note … |
| 修订版 | D |
| 文件格式/大小 | PDF / 672 Kb |
| 文件语言 | 英语 |
ELECTRICAL CHARACTERISTICS (Continued). Note 1:. Note 3:. Note 2:. Note 4:. Note 5:. TABLE 2: ELECTRICAL TEST REQUIREMENTS
该数据表的模型线
文件文字版本
RH119
ELECTRICAL CHARACTERISTICS (Continued) Note 1:
For supply voltages less than ±15V, the maximum input voltage is
Note 3:
The offset voltages and currents given are the maximum values equal to the supply voltage. required to drive the output within 1V of either supply with a 1mA load––
Note 2:
Unless otherwise noted, supply voltage equals ±15V, V thus, these parameters define an error band and take into account the CM = 0V and T worst-case effects of voltage gain and input impedance. A = 25°C. The GND pin is grounded. Note that the maximum voltage allowed between the GND pin and V+ is 18V. Do not tie the GND pin
Note 4:
Response time specified for a 100mV input step with 5mV to V– when the power supply voltage exceeds ±9V. The offset voltage, overdrive. offset current and bias current specifications apply for all supply voltages
Note 5:
VS = ±15V, VCM = 0V, TA = 25°C unless otherwise noted. between ±15V and 5V unless otherwise specified.
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup Final Electrical Test Requirements (Method 5004) 1*, 2, 3, 4, 5, 6 1, tests after cooldown as the final electrical test in accordance with Group A Test Requirements (Method 5005) 1, 2, 3, 4, 5, 6 method 5004 of MIL-STD-883 Class B. The verified failures (including Group B End Point Electrical Parameters (Method 1, 2, 3 Delta parameters) of group A, subgroup 1, after burn-in divided by the 5005) total number of devices submitted for burn-in in that lot shall be used to *PDA Applies to subgroup 1. See PDA Test Notes. determine the percent for the lot. Analog Devices reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
15V 10k V+ 10k – 10k OUT1 SIDE 1 + GND1 100Ω – OUT2 SIDE 2 + GND2 V– 10k –15V RH119 TDBC
REVISION HISTORY REV DATE DESCRIPTION PAGE NUMBER
D 04/19 Obsoleting J package and updating to ADI format I.D.No.66-10-0176 Rev. D Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications For more information www.a subject to change without notice. No license is granted by implication or other nalog.com wise under any patent or patent rights of Analog Devices. 3 Document Outline Description Burn-In Circuit Package/Order Information Absolute Maximum Ratings Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Revision History
ELECTRICAL CHARACTERISTICS (Continued) Note 1:
For supply voltages less than ±15V, the maximum input voltage is
Note 3:
The offset voltages and currents given are the maximum values equal to the supply voltage. required to drive the output within 1V of either supply with a 1mA load––
Note 2:
Unless otherwise noted, supply voltage equals ±15V, V thus, these parameters define an error band and take into account the CM = 0V and T worst-case effects of voltage gain and input impedance. A = 25°C. The GND pin is grounded. Note that the maximum voltage allowed between the GND pin and V+ is 18V. Do not tie the GND pin
Note 4:
Response time specified for a 100mV input step with 5mV to V– when the power supply voltage exceeds ±9V. The offset voltage, overdrive. offset current and bias current specifications apply for all supply voltages
Note 5:
VS = ±15V, VCM = 0V, TA = 25°C unless otherwise noted. between ±15V and 5V unless otherwise specified.
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup Final Electrical Test Requirements (Method 5004) 1*, 2, 3, 4, 5, 6 1, tests after cooldown as the final electrical test in accordance with Group A Test Requirements (Method 5005) 1, 2, 3, 4, 5, 6 method 5004 of MIL-STD-883 Class B. The verified failures (including Group B End Point Electrical Parameters (Method 1, 2, 3 Delta parameters) of group A, subgroup 1, after burn-in divided by the 5005) total number of devices submitted for burn-in in that lot shall be used to *PDA Applies to subgroup 1. See PDA Test Notes. determine the percent for the lot. Analog Devices reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
15V 10k V+ 10k – 10k OUT1 SIDE 1 + GND1 100Ω – OUT2 SIDE 2 + GND2 V– 10k –15V RH119 TDBC
REVISION HISTORY REV DATE DESCRIPTION PAGE NUMBER
D 04/19 Obsoleting J package and updating to ADI format I.D.No.66-10-0176 Rev. D Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications For more information www.a subject to change without notice. No license is granted by implication or other nalog.com wise under any patent or patent rights of Analog Devices. 3 Document Outline Description Burn-In Circuit Package/Order Information Absolute Maximum Ratings Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Revision History