Datasheet ADG604 (Analog Devices) - 9
| 制造商 | Analog Devices |
| 描述 | 1 pC Charge Injection, 100 pA Leakage CMOS 5 V/5 V/3 V 4-Channel Multiplexer |
| 页数 / 页 | 11 / 9 — ADG604. Test Circuits. IDS. IS (OFF). ID (OFF). ID (ON). ON = V1/IDS. … |
| 修订版 | A |
| 文件格式/大小 | PDF / 236 Kb |
| 文件语言 | 英语 |
ADG604. Test Circuits. IDS. IS (OFF). ID (OFF). ID (ON). ON = V1/IDS. VDD. VSS. 0.1. ADDRESS. 50%. DRIVE (VIN). 90%. VS2. VOUT. OUT. TRANSITION. +2.4V
该数据表的模型线
文件文字版本
ADG604 Test Circuits IDS V1 IS (OFF) ID (OFF) ID (ON) S D S D A A S D NC A VS VS VD V R D ON = V1/IDS
Test Circuit 1. On Resistance Test Circuit 2. Off Leakage Test Circuit 3. On Leakage
VDD VSS 0.1 F 0.1 F 3V ADDRESS VDD VSS 50% 50% DRIVE (VIN) V 0V A1 S1 S1 A0 S2 VS S3 90% S4 VS2 VOUT 90% D V t OUT TRANSITION +2.4V EN RL CL tTRANSITION GND 300 35pF
Test Circuit 4. Switching Time of Multiplexer, tTRANSITION
VDD VSS 0.1 F 0.1 F VDD VSS S1 VS 3V A1 ADDRESS A0 S2 DRIVE (VIN) VS 50 0V S3 S4 80% 80% D V V OUT OUT +2.4V EN RL CL GND 300 35pF tBBM
Test Circuit 5. Break-Before-Make Delay, tBBM
VDD VSS 0.1 F 0.1 F 3V V ENABLE DD VSS 50% 50% DRIVE (VIN) 0V A1 S1 VS A0 S2 S3 V0 0.9V0 0.9V0 S4 OUTPUT 0V EN D VOUT VS 50 t R ON(EN) L CL t GND 300 35pF OFF(EN)
Test Circuit 6. Enable Delay, tON (EN), tOFF (EN) REV. A –9–
Test Circuit 1. On Resistance Test Circuit 2. Off Leakage Test Circuit 3. On Leakage
VDD VSS 0.1 F 0.1 F 3V ADDRESS VDD VSS 50% 50% DRIVE (VIN) V 0V A1 S1 S1 A0 S2 VS S3 90% S4 VS2 VOUT 90% D V t OUT TRANSITION +2.4V EN RL CL tTRANSITION GND 300 35pF
Test Circuit 4. Switching Time of Multiplexer, tTRANSITION
VDD VSS 0.1 F 0.1 F VDD VSS S1 VS 3V A1 ADDRESS A0 S2 DRIVE (VIN) VS 50 0V S3 S4 80% 80% D V V OUT OUT +2.4V EN RL CL GND 300 35pF tBBM
Test Circuit 5. Break-Before-Make Delay, tBBM
VDD VSS 0.1 F 0.1 F 3V V ENABLE DD VSS 50% 50% DRIVE (VIN) 0V A1 S1 VS A0 S2 S3 V0 0.9V0 0.9V0 S4 OUTPUT 0V EN D VOUT VS 50 t R ON(EN) L CL t GND 300 35pF OFF(EN)
Test Circuit 6. Enable Delay, tON (EN), tOFF (EN) REV. A –9–