Datasheet IRLR8743PbF, IRLU8743PbF (Infineon) - 7
| 制造商 | Infineon |
| 描述 | HEXFET Power MOSFET |
| 页数 / 页 | 12 / 7 — D.U.T. Fig 15. Fig 16 |
| 修订版 | 01_01 |
| 文件格式/大小 | PDF / 387 Kb |
| 文件语言 | 英语 |
D.U.T. Fig 15. Fig 16
该数据表的模型线
文件文字版本
IRLR/U8743PbF Driver Gate Drive P.W.
D.U.T
Period D = P.W. Period + V * Circuit Layout Considerations GS=10V • Low Stray Inductance • Ground Plane - • Low Leakage Inductance D.U.T. I Current Transformer SD Waveform + Reverse Recovery Body Diode Forward Current Current - + - di/dt D.U.T. VDS Waveform Diode Recovery dv/dt VDD • dv/dt controlled by R V G DD Re-Applied RG + Voltage • Driver same type as D.U.T. Body Diode Forward Drop • ISD controlled by Duty Factor "D" - Inductor Curent • D.U.T. - Device Under Test Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices
Fig 15.
Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs Id Vds Vgs Vgs(th) Qgodr Qgd Qgs2 Qgs1
Fig 16.
Gate Charge Waveform www.irf.com 7
D.U.T
Period D = P.W. Period + V * Circuit Layout Considerations GS=10V • Low Stray Inductance • Ground Plane - • Low Leakage Inductance D.U.T. I Current Transformer SD Waveform + Reverse Recovery Body Diode Forward Current Current - + - di/dt D.U.T. VDS Waveform Diode Recovery dv/dt VDD • dv/dt controlled by R V G DD Re-Applied RG + Voltage • Driver same type as D.U.T. Body Diode Forward Drop • ISD controlled by Duty Factor "D" - Inductor Curent • D.U.T. - Device Under Test Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices
Fig 15.
Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs Id Vds Vgs Vgs(th) Qgodr Qgd Qgs2 Qgs1
Fig 16.
Gate Charge Waveform www.irf.com 7