Datasheet REF20-Q1 (Texas Instruments) - 6

制造商Texas Instruments
描述Automotive low-drift, low-power, series voltage reference
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REF20-Q1. www.ti.com. 7.5 Electrical Characteristics. PARAMETER. TEST CONDITIONS. MIN. TYP. MAX. UNIT. ACCURACY AND DRIFT

REF20-Q1 www.ti.com 7.5 Electrical Characteristics PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ACCURACY AND DRIFT

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REF20-Q1
SBOSA80 – DECEMBER 2021
www.ti.com 7.5 Electrical Characteristics
At TA = 25°C, IL = 0 mA, and VIN = 5 V, unless otherwise noted. Both VREF and VBIAS have the same specifications.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ACCURACY AND DRIFT
Output voltage accuracy –0.05% 0.05% Output voltage temperature coefficient (1) –40°C ≤ TA ≤ 125°C ±3 ±8 ppm/°C VREF and VBIAS tracking over temperature (2) –40°C ≤ TA ≤ 125°C ±2 ±7 ppm/°C
LINE AND LOAD REGULATION
ΔVO(ΔVI) Line regulation VREF + 0.02 V ≤ VIN ≤ 5.5 V 3 35 ppm/V 0 mA ≤ I Sourcing L ≤ 20 mA , 8 20 VREF + 0.6 V ≤ VIN ≤ 5.5 V ΔVO(ΔIL) Load regulation ppm/mA 0 mA ≤ I Sinking L ≤ –20 mA, 8 20 VREF + 0.02 V ≤ VIN ≤ 5.5 V
POWER SUPPLY
360 430 Active mode –40°C ≤ TA ≤ 125°C 460 ICC Supply current µA 3.3 5 Shutdown mode –40°C ≤ TA ≤ 125°C 9 Device in shutdown mode (EN = 0) 0 0.7 Enable voltage V Device in active mode (EN = 1) VIN – 0.7 VIN 10 20 Dropout voltage mV IL = 20 mA 600 ISC Short-circuit current 50 mA ton Turn-on time 0.1% settling, CL = 1 µF 500 µs
NOISE
Low-frequency noise (3) 0.1 Hz ≤ f ≤ 10 Hz 12 ppmPP Output voltage noise density f = 100 Hz 0.25 ppm/√ Hz
CAPACITIVE LOAD
Stable output capacitor range 0 10 µF
HYSTERESIS AND LONG TERM STABILITY
Long-term stability (4) 0 to 1000 hours 25 ppm Cycle 1 60 Output voltage hysteresis (5) 25°C, –40°C, 125°C, 25°C ppm Cycle 2 35 (1) Temperature drift is specified according to the box method. See the Section 9.3 section for more details. (2) The VREF and VBIAS tracking over temperature specification is explained in more detail in the Section 9.3 section. (3) The peak-to-peak noise measurement procedure is explained in more detail in the Section 8.4 section. (4) Long-term stability measurement procedure is explained in more in detail in the Section 8.2 section. (5) The thermal hysteresis measurement procedure is explained in more detail in the Section 8.3 section. 6 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: REF20-Q1 Document Outline 1 Features 2 Applications 3 Description Table of Contents 4 Revision History 5 Device Comparison Table 6 Pin Configuration and Functions 7 Specifications 7.1 Absolute Maximum Ratings 7.2 ESD Ratings 7.3 Recommended Operating Conditions 7.4 Thermal Information 7.5 Electrical Characteristics 7.6 Typical Characteristics 8 Parameter Measurement Information 8.1 Solder Heat Shift 8.2 Long-Term Stability 8.3 Thermal Hysteresis 8.4 Noise Performance 9 Detailed Description 9.1 Overview 9.2 Functional Block Diagram 9.3 Feature Description 9.3.1 VREF and VBIAS Tracking 9.3.2 Low Temperature Drift 9.3.3 Load Current 9.4 Device Functional Modes 10 Applications and Implementation 10.1 Application Information 10.2 Typical Application 10.2.1 Low-Side, Current-Sensing Application 10.2.1.1 Design Requirements 10.2.1.2 Detailed Design Procedure 10.2.1.2.1 Shunt Resistor 10.2.1.2.2 Differential Amplifier 10.2.1.2.3 Voltage Reference 10.2.1.2.4 Error Calculations 10.2.1.2.5 Application Curves 11 Power-Supply Recommendations 12 Layout 12.1 Layout Guidelines 12.2 Layout Example 13 Device and Documentation Support 13.1 Documentation Support 13.1.1 Related Documentation 13.2 Receiving Notification of Documentation Updates 13.3 Support Resources 13.4 Trademarks 13.5 Electrostatic Discharge Caution 13.6 Glossary 14 Mechanical, Packaging, and Orderable Information