Datasheet LM35 (Texas Instruments) - 9

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SNIS159H – AUGUST 1999 – REVISED DECEMBER 2017
6.8 Electrical Characteristics: LM35, LM35C, LM35D
Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
LM35 LM35C, LM35D PARAMETER TEST CONDITIONS UNIT MIN TYP MAX MIN TYP MAX
±0.4 ±0.4 TA = 25°C Tested Limit(2) ±1 ±1 Design Limit(3) ±0.5 ±0.5 TA = –10°C Tested Limit(2) Accuracy, LM35, Design Limit(3) ±1.5 °C LM35C(1) ±0.8 ±0.8 TA = TMAX Tested Limit(2) ±1.5 Design Limit(3) ±1.5 ±0.8 ±0.8 TA = TMIN Tested Limit(2) Design Limit(3) ±1.5 ±2 ±0.6 TA = 25°C Tested Limit(2) ±1.5 Design Limit(3) ±0.9 Accuracy, T Tested Limit(2) °C LM35D(1) A = TMAX Design Limit(3) ±2 ±0.9 TA = TMIN Tested Limit(2) Design Limit(3) ±2 ±0.3 ±0.2 Nonlinearity(4) TMIN ≤ TA ≤ TMAX, Tested Limit(2) °C –40°C ≤ TJ ≤ 125°C Design Limit(3) ±0.5 ±0.5 10 10 TMIN ≤ TA ≤ TMAX, Tested Limit(2) 9.8 –40°C ≤ TJ ≤ 125°C Sensor gain Design Limit(3) 9.8 mV/°C (average slope) 10 10 Tested Limit(2) 10.2 Design Limit(3) 10.2 ±0.4 ±0.4 TA = 25°C Tested Limit(2) ±2 ±2 Load regulation(5) Design Limit(3) mV/mA 0 ≤ IL ≤ 1 mA ±0.5 ±0.5 TMIN ≤ TA ≤ TMAX, Tested Limit(2) –40°C ≤ TJ ≤ 125°C Design Limit(3) ±5 ±5 (1) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C). (2) Tested Limits are ensured and 100% tested in production. (3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. Copyright © 1999–2017, Texas Instruments Incorporated Submit Documentation Feedback 9 Product Folder Links: LM35 Document Outline 1 Features 2 Applications 3 Description Table of Contents 4 Revision History 5 Pin Configuration and Functions 6 Specifications 6.1 Absolute Maximum Ratings 6.2 ESD Ratings 6.3 Recommended Operating Conditions 6.4 Thermal Information 6.5 Electrical Characteristics: LM35A, LM35CA Limits 6.6 Electrical Characteristics: LM35A, LM35CA 6.7 Electrical Characteristics: LM35, LM35C, LM35D Limits 6.8 Electrical Characteristics: LM35, LM35C, LM35D 6.9 Typical Characteristics 7 Detailed Description 7.1 Overview 7.2 Functional Block Diagram 7.3 Feature Description 7.3.1 LM35 Transfer Function 7.4 Device Functional Modes 8 Application and Implementation 8.1 Application Information 8.1.1 Capacitive Drive Capability 8.2 Typical Application 8.2.1 Basic Centigrade Temperature Sensor 8.2.1.1 Design Requirements 8.2.1.2 Detailed Design Procedure 8.2.1.3 Application Curve 8.3 System Examples 9 Power Supply Recommendations 10 Layout 10.1 Layout Guidelines 10.2 Layout Example 11 Device and Documentation Support 11.1 Receiving Notification of Documentation Updates 11.2 Community Resources 11.3 Trademarks 11.4 Electrostatic Discharge Caution 11.5 Glossary 12 Mechanical, Packaging, and Orderable Information