Datasheet LTC2268-12, LTC2267-12, LTC2266-12 (Analog Devices) - 6

LTC2268-12/ LTC2267-12/LTC2266-12
elecTrical characTerisTics The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS DIGITAL DATA OUTPUTS (RTERM = 100Ω Differential, CL = 2pF to GND on Each Output)
tSER Serial Data Bit Period 2-Lanes, 16-Bit Serialization 1/(8 • fS) s 2-Lanes, 14-Bit Serialization 1/(7 • fS) 2-Lanes, 12-Bit Serialization 1/(6 • fS) 1-Lane, 16-Bit Serialization 1/(16 • fS) 1-Lane, 14-Bit Serialization 1/(14 • fS) 1-Lane, 12-Bit Serialization 1/(12 • fS) tFRAME FR to DCO Delay (Note 8) l 0.35 • tSER 0.5 • tSER 0.65 • tSER s tDATA DATA to DCO Delay (Note 8) l 0.35 • tSER 0.5 • tSER 0.65 • tSER s tPD Propagation Delay (Note 8) l 0.7n + 2 • tSER 1.1n + 2 • tSER 1.5n + 2 • tSER s tR Output Rise Time Data, DCO, FR, 20% to 80% 0.17 ns tF Output Fall Time Data, DCO, FR, 20% to 80% 0.17 ns DCO Cycle-Cycle Jitter tSER = 1ns 60 psP-P Pipeline Latency 6 Cycles
SPI PORT TIMING (Note 8)
tSCK SCK Period Write Mode l 40 ns Readback Mode, CSDO = 20pF, RPULLUP = 2k l 250 ns tS CS to SCK Setup Time l 5 ns tH SCK to CS Setup Time l 5 ns tDS SDI Setup Time l 5 ns tDH SDI Hold Time l 5 ns tDO SCK falling to SDO Valid Readback Mode, CSDO = 20pF, RPULLUP = 2k l 125 ns
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 6:
Integral nonlinearity is defined as the deviation of a code from a may cause permanent damage to the device. Exposure to any Absolute best fit straight line to the transfer curve. The deviation is measured from Maximum Rating condition for extended periods may affect device the center of the quantization band. reliability and lifetime.
Note 7:
Offset error is the offset voltage measured from –0.5 LSB when
Note 2:
All voltage values are with respect to GND with GND and OGND the output code flickers between 0000 0000 0000 and 1111 1111 1111 in shorted (unless otherwise noted). 2’s complement output mode.
Note 3:
When these pin voltages are taken below GND or above VDD,
Note 8:
Guaranteed by design, not subject to test. they will be clamped by internal diodes. This product can handle input
Note 9:
VDD = OVDD = 1.8V, fSAMPLE = 125MHz (LTC2268), 105MHz currents of greater than 100mA below GND or above VDD without latchup. (LTC2267), or 80MHz (LTC2266), 2-lane output mode, ENC+ = single-
Note 4:
When these pin voltages are taken below GND they will be ended 1.8V square wave, ENC– = 0V, input range = 2VP-P with differential clamped by internal diodes. When these pin voltages are taken above drive, unless otherwise noted. The supply current and power dissipation VDD they will not be clamped by internal diodes. This product can handle specifications are totals for the entire chip, not per channel. input currents of greater than 100mA below GND without latchup.
Note 10:
Recommended operating conditions.
Note 5:
VDD = OVDD = 1.8V, fSAMPLE = 125MHz (LTC2268), 105MHz
Note 11:
The maximum sampling frequency depends on the speed grade (LTC2267), or 80MHz (LTC2266), 2-lane output mode, differential ENC+/ of the part and also which serialization mode is used. The maximum serial ENC– = 2VP-P sine wave, input range = 2VP-P with differential drive, unless data rate is 1000Mbps so tSER must be greater than or equal to 1ns. otherwise noted. 22687612fa 6 Document Outline Features Description Applications Typical Application Absolute Maximum Ratings Pin Configuration Order Information Converter Characteristics Analog Input Digital Accuracy Internal Reference Characteristics Digital Inputs and Outputs Power Requirements Timing Characteristics Electrical Characteristics Timing Diagrams Typical Performance Characteristics Pin Functions Block Diagram Applications Information Typical Applications Package Description Revision History Related Parts