Datasheet ADXL312 (Analog Devices) - 10

制造商Analog Devices
描述3-Axis, ±1.5 g/±3 g/±6 g/±12 g Digital Accelerometer
页数 / 页33 / 10 — Data Sheet. ADXL312. U P. ER P. 0.2. 0.4. 0.6. 0.8. 1.0. 1.2. 1.4. 1.6. …
修订版B
文件格式/大小PDF / 536 Kb
文件语言英语

Data Sheet. ADXL312. U P. ER P. 0.2. 0.4. 0.6. 0.8. 1.0. 1.2. 1.4. 1.6. 1.8. 2.0. SELF-TEST RESPONSE (g. CURRENT (nA). PU O. N E. R PE. PER. 100. 120. 140. 160. 180. 200

Data Sheet ADXL312 U P ER P 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 SELF-TEST RESPONSE (g CURRENT (nA) PU O N E R PE PER 100 120 140 160 180 200

该数据表的模型线

文件文字版本

Data Sheet ADXL312 80 80 70 70 ) ) % % ( 60 ( 60 N N IO IO T T A 50 A 50 L L U P PU 40 40 PO PO F F O O T 30 T 30 EN EN C C 20 R 20 ER P PE 10 10 0
5
0
18
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
-01
0 0 0 0 0 0 0 0 0 0 0
0 1
30 50 70 90
1- 79
11 13 15 17 19 21 23 25 27 29 31
79
SELF-TEST RESPONSE (g )
08
CURRENT (nA)
08 Figure 15. X-Axis Self-Test Delta, VS = VDD I/O = 3.3 V, 25°C Figure 18. Standby Mode Current Consumption, VS = VDD I/O = 3.3 V, 25°C
70 35 60 30 ) ) % % ( ( N 50 N 25 IO IO T T A A L L 40 20 PU PU O PO P F 30 F 15 O O T T N E EN C 20 C 10 R PE PER 10 5 0
6
0 .1 .9 .7 .5 .3 .1 .9 .7 .5 .3
01 19 1- -0
–2 –1 –1 –1 –1 –1 –0 –0 –0 –0 100 120 140 160 180 200 220 240 260 280 300
79 91 08
CURRENT CONSUMPTION (µA) SELF-TEST RESPONSE (g )
87 0 Figure 16. Y-Axis Self-Test Delta, VS = VDD I/O = 3.3 V, 25°C Figure 19. Current Consumption, Measurement Mode, Data Rate = 100 Hz, VS = VDD I/O = 3.3 V, 25°C
80 200 70 ) % ( 60 150 N A) IO µ T ( A 50 L NT PU 40 100 PO F CURRE O Y T 30 L P EN C UP R S 20 50 PE 10 0 0
17 3
0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
0
2.0 2.4 2.8 3.2 3.6
3 1- 2 1- 79
SELF-TEST RESPONSE (g )
79 08
SUPPLY VOLTAGE (V)
08 Figure 17. Z-Axis Self-Test Delta, VS = VDD I/O = 3.3 V, 25°C Figure 20. Supply Current vs. Supply Voltage, VS at 25°C Rev. B | Page 9 of 32 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Power Sequencing Power Savings Power Modes Autosleep Mode Standby Mode Serial Communications Serial Port I/O Default states SPI Preventing Bus Traffic Errors I2C Interrupts DATA_READY Activity Inactivity Watermark Overrun FIFO Bypass Mode FIFO Mode Stream Mode Trigger Mode Retrieving Data from FIFO Self-Test Register Map Register Definitions Register 0x00—DEVID (Read Only) Register 0x1E, Register 0x1F, Register 0x20—OFSX, OFSY, OFSZ (Read/Write) Register 0x24—THRESH_ACT (Read/Write) Register 0x25—THRESH_INACT (Read/Write) Register 0x26—TIME_INACT (Read/Write) Register 0x27—ACT_INACT_CTL (Read/Write) ACT AC/DC and INACT AC/DC Bits ACT_x Enable Bits and INACT_x Enable Bits Register 0x2C—BW_RATE (Read/Write) LOW_POWER Bit Rate Bits Register 0x2D—POWER_CTL (Read/Write) Link Bit AUTO_SLEEP Bit Measure Bit Sleep Bit Wake-Up Bits Register 0x2E—INT_ENABLE (Read/Write) Register 0x2F—INT_MAP (Read/Write) Register 0x30—INT_SOURCE (Read Only) Register 0x31—DATA_FORMAT (Read/Write) SELF_TEST Bit SPI Bit INT_INVERT Bit FULL_RES Bit Justify Bit Range Bits Register 0x32 to Register 0x37—DATAX0, DATAX1, DATAY0, DATAY1, DATAZ0, DATAZ1 (Read Only) Register 0x38—FIFO_CTL (Read/Write) FIFO_MODE Bits Trigger Bit Samples Bits 0x39—FIFO_STATUS (Read Only) FIFO_TRIG Bit Entries Bits Applications Information Power Supply Decoupling Mechanical Considerations for Mounting Threshold Link Mode Sleep Mode vs. Low Power Mode Using Self-Test Data Formatting of Upper Data Rates Noise Performance Axes of Acceleration Sensitivity Solder Profile Outline Dimensions Ordering Guide Automotive Products