Datasheet ADIS16060 (Analog Devices) - 4
| 制造商 | Analog Devices |
| 描述 | Wide Bandwidth Yaw Rate Gyroscope with SPI |
| 页数 / 页 | 13 / 4 — Data Sheet. ADIS16060. SPECIFICATIONS. Table 1. Parameter. Test … |
| 修订版 | A |
| 文件格式/大小 | PDF / 309 Kb |
| 文件语言 | 英语 |
Data Sheet. ADIS16060. SPECIFICATIONS. Table 1. Parameter. Test Conditions/Comments. Min1. Typ. Max. Unit
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Data Sheet ADIS16060 SPECIFICATIONS
TA = 25°C, VCC = 5 V, angular rate = 0°/sec, COUT = 0.01 μF, ±1 g, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min1 Typ Max Unit
SENSITIVITY Dynamic Range2 Full-scale range over specifications range ±50 ±80 °/sec Initial Clockwise rotation is positive output, 0.0110 0.0122 0.0134 °/sec/LSB TA = −40°C to +85°C Change Over Temperature3 VCC = 4.75 V to 5.25 V ±3 % Nonlinearity Best fit straight line 0.1 °/sec NULL Initial Nominal 0°/sec output is 8192 LSB −44 +44 °/sec Change Over Temperature3 VCC = 4.75 V to 5.25 V ±0.11 °/sec/°C Turn-On Time Power on to ±0.5°/sec of final value 10 ms Linear Acceleration Effect Any axis ±0.1 °/sec/g Voltage Sensitivity VCC = 4.75 V to 5.25 V ±0.5 °/sec/V NOISE PERFORMANCE Rate Noise Density @ 25°C 0.04 °/sec/√Hz FREQUENCY RESPONSE 3 dB Bandwidth (User-Selectable)4 COUT = 0 µF 1 1000 Hz Sensor Resonant Frequency 14.5 kHz SELF-TEST RESPONSE Positive Self-Test5 See Table 5 +6226 LSB Negative Self-Test5 See Table 5 −6226 LSB TEMPERATURE SENSOR Reading at 298 K 7700 8192 8684 LSB Scale Factor Proportional to absolute temperature 0.034 K/LSB LOGIC INPUTS Input High Voltage, VINH 0.7 × VCC V Input Low Voltage, VINL 0.8 V Input Current, IIN Typically 10 nA −1 +1 µA Input Capacitance, CIN (DIN) 8 pF Input Capacitance, CIN (MSEL1, MSEL2) 5 pF ANALOG INPUTS For VIN < VCC Resolution 14 Bits Integral Nonlinearity Best fit straight line −6 +6 LSB Differential Nonlinearity No missing codes to 13 bits −1 +6 LSB Offset Error −10 +10 mV Offset Error Temperature Drift ±0.3 ppm/°C Gain Error −40 +40 mV Gain Error Temperature Drift ±0.3 ppm/°C Input Voltage Range 0 VCC V Leakage Current 1 nA DIGITAL OUTPUTS Output High Voltage, VOH ISOURCE = 500 µA VCC − 0.3 V Output Low Voltage, VOL ISINK = 500 µA 0.4 V CONVERSION RATE Conversion Time 10 µs Throughput Rate 100 kSPS Rev. A | Page 3 of 12 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Analog-to-Digital Converter Input Rate Sensitive Axis Basic Operation Serial Peripheral Interface (SPI) Selecting Output Data Output Data Access Output Data Formatting ADC Conversion Applications Information Supply And Common Considerations Setting Bandwidth Increasing Measurement Range Dynamic Digital Sensitivity Scaling Temperature Measurements Self-Test Function Outline Dimensions Ordering Guide
Data Sheet ADIS16060 SPECIFICATIONS
TA = 25°C, VCC = 5 V, angular rate = 0°/sec, COUT = 0.01 μF, ±1 g, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min1 Typ Max Unit
SENSITIVITY Dynamic Range2 Full-scale range over specifications range ±50 ±80 °/sec Initial Clockwise rotation is positive output, 0.0110 0.0122 0.0134 °/sec/LSB TA = −40°C to +85°C Change Over Temperature3 VCC = 4.75 V to 5.25 V ±3 % Nonlinearity Best fit straight line 0.1 °/sec NULL Initial Nominal 0°/sec output is 8192 LSB −44 +44 °/sec Change Over Temperature3 VCC = 4.75 V to 5.25 V ±0.11 °/sec/°C Turn-On Time Power on to ±0.5°/sec of final value 10 ms Linear Acceleration Effect Any axis ±0.1 °/sec/g Voltage Sensitivity VCC = 4.75 V to 5.25 V ±0.5 °/sec/V NOISE PERFORMANCE Rate Noise Density @ 25°C 0.04 °/sec/√Hz FREQUENCY RESPONSE 3 dB Bandwidth (User-Selectable)4 COUT = 0 µF 1 1000 Hz Sensor Resonant Frequency 14.5 kHz SELF-TEST RESPONSE Positive Self-Test5 See Table 5 +6226 LSB Negative Self-Test5 See Table 5 −6226 LSB TEMPERATURE SENSOR Reading at 298 K 7700 8192 8684 LSB Scale Factor Proportional to absolute temperature 0.034 K/LSB LOGIC INPUTS Input High Voltage, VINH 0.7 × VCC V Input Low Voltage, VINL 0.8 V Input Current, IIN Typically 10 nA −1 +1 µA Input Capacitance, CIN (DIN) 8 pF Input Capacitance, CIN (MSEL1, MSEL2) 5 pF ANALOG INPUTS For VIN < VCC Resolution 14 Bits Integral Nonlinearity Best fit straight line −6 +6 LSB Differential Nonlinearity No missing codes to 13 bits −1 +6 LSB Offset Error −10 +10 mV Offset Error Temperature Drift ±0.3 ppm/°C Gain Error −40 +40 mV Gain Error Temperature Drift ±0.3 ppm/°C Input Voltage Range 0 VCC V Leakage Current 1 nA DIGITAL OUTPUTS Output High Voltage, VOH ISOURCE = 500 µA VCC − 0.3 V Output Low Voltage, VOL ISINK = 500 µA 0.4 V CONVERSION RATE Conversion Time 10 µs Throughput Rate 100 kSPS Rev. A | Page 3 of 12 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Analog-to-Digital Converter Input Rate Sensitive Axis Basic Operation Serial Peripheral Interface (SPI) Selecting Output Data Output Data Access Output Data Formatting ADC Conversion Applications Information Supply And Common Considerations Setting Bandwidth Increasing Measurement Range Dynamic Digital Sensitivity Scaling Temperature Measurements Self-Test Function Outline Dimensions Ordering Guide