Datasheet AD704/883B (Analog Devices) - 3
制造商 | Analog Devices |
描述 | Quad Picoampere Input Current, Precision, Bipolar Op Amp |
页数 / 页 | 3 / 3 — AD704/883B. 3.2.1. Functional Block Diagram and Terminal Assignments. LCC … |
修订版 | C |
文件格式/大小 | PDF / 133 Kb |
文件语言 | 英语 |
AD704/883B. 3.2.1. Functional Block Diagram and Terminal Assignments. LCC (E-20A) Connection Diagram. AD704. 20 19. +IN1 4. 18 +IN4
该数据表的模型线
文件文字版本
AD704/883B 3.2.1 Functional Block Diagram and Terminal Assignments. LCC (E-20A) Connection Diagram AD704 1 T1 T4 4 N N –I OU NC OU –I 3 2 1 20 19 +IN1 4 18 +IN4 NC 5 17 NC AMP 1 AMP 4 +V 6 S 16 –VS AMP 2 AMP 3 NC 7 15 NC +IN2 8 14 +IN3 9 10 11 12 13 2 3 N2 T T NC N3 –I –I
1
OU OU
-00 06
NC = NO CONNECT
70 0
3.2.4 Microcircuit Technology Group.
This microcircuit is covered by technology group (49).
4.2.1 Life Test/Burn-In Circuit.
Steady state life test is per MIL-STD-883 Method 1005. Burn-in MIL-STD-833 Method 1015 Test Condition (B).
2kΩ 2kΩ +15V 0.1µF 6 3 19 1 2 4 20 4 18 2kΩ 2kΩ LCC PIN DESIGNATORS +10V SHOWN 2kΩ 2kΩ 8 14 10 2 12 3 9 13 16 0.1µF –15V 2kΩ 2kΩ MR-820 MR-820 MR-820 47µF 47µF 47µF
2
+ + +
00
+15V –15V +10V
6- 00 07
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Rev. C | Page 3 of 3 Document Outline 1.1 SCOPE 1.2 PART NUMBER Part Number 1.2.3 CASE OUTLINE (X) Package Description 1.3 ABSOLUTE MAXIMUM RATINGS 1.4 THERMAL CHARACTERISTICS 3.2.1 FUNCTIONAL BLOCK DIAGRAM AND TERMINAL ASSIGNMENTS 3.2.4 MICROCIRCUIT TECHNOLOGY GROUP 4.2.1 LIFE TEST/BURN-IN CIRCUIT