Datasheet RH111 (Analog Devices) - 3
| 制造商 | Analog Devices |
| 描述 | Voltage Comparator |
| 页数 / 页 | 4 / 3 — Note 1:. Note 6:. Note 2:. Note 3:. Note 7:. Note 4:. Note 8:. Note 9:. … |
| 文件格式/大小 | PDF / 60 Kb |
| 文件语言 | 英语 |
Note 1:. Note 6:. Note 2:. Note 3:. Note 7:. Note 4:. Note 8:. Note 9:. Note 5:. TOTAL DOSE BIAS CIRCUIT
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文件文字版本
RH111
Note 1:
Applicable for ±15V supplies. The positive input voltage limit is
Note 6:
Do not short the Strobe pin to ground. It should be current driven 30V above the negative supply. The negative input voltage limit is the at 3mA to 5mA for the shortest strobe time. Currents as low as 500μA will negative supply. strobe the RH111 if speed is not important. External leakage on the Strobe
Note 2:
T pin in excess of 0.2μA when the strobe is “off ” can cause offset voltage JMAX = 150°C shifts.
Note 3:
Offset voltage, offset current and bias current specifications apply for any supply voltage from a single 5V up to ±15V supplies.
Note 7:
RL = 1kΩ, – 10V ≤ VOUT ≤ 14.5V
Note 4:
Offset voltage and offset currents shown are the maximum values
Note 8:
VGND = 0V. required to drive the output within a volt of either supply with a 1mA load.
Note 9:
VS = ±15V, VCM = 0V, VGND = V–, TA = 25°C, unless otherwise These parameters define an error band and take into account the worst- noted. case effects of voltage gain and input impedance.
Note 5:
Response time is specified for a 100mV input step with 5mV overdrive with the collector output terminated with a 500Ω pull-up resistor tied to 5V.
TOTAL DOSE BIAS CIRCUIT
12V 5.1k 12Ω 5.1k 2 + 8 7 3 – 1 4 12Ω –12V RH111 TA01
W U TABLE 2: ELECTRICAL TEST REQUIRE E TS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup Group B and D End Point Electrical Parameters 1,2,3 1, after burn-in divided by the total number of devices submitted for burn- (Method 5005) in in that lot shall be used to determine the percent for the lot. * PDA Applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given. Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen- tation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 3
Note 1:
Applicable for ±15V supplies. The positive input voltage limit is
Note 6:
Do not short the Strobe pin to ground. It should be current driven 30V above the negative supply. The negative input voltage limit is the at 3mA to 5mA for the shortest strobe time. Currents as low as 500μA will negative supply. strobe the RH111 if speed is not important. External leakage on the Strobe
Note 2:
T pin in excess of 0.2μA when the strobe is “off ” can cause offset voltage JMAX = 150°C shifts.
Note 3:
Offset voltage, offset current and bias current specifications apply for any supply voltage from a single 5V up to ±15V supplies.
Note 7:
RL = 1kΩ, – 10V ≤ VOUT ≤ 14.5V
Note 4:
Offset voltage and offset currents shown are the maximum values
Note 8:
VGND = 0V. required to drive the output within a volt of either supply with a 1mA load.
Note 9:
VS = ±15V, VCM = 0V, VGND = V–, TA = 25°C, unless otherwise These parameters define an error band and take into account the worst- noted. case effects of voltage gain and input impedance.
Note 5:
Response time is specified for a 100mV input step with 5mV overdrive with the collector output terminated with a 500Ω pull-up resistor tied to 5V.
TOTAL DOSE BIAS CIRCUIT
12V 5.1k 12Ω 5.1k 2 + 8 7 3 – 1 4 12Ω –12V RH111 TA01
W U TABLE 2: ELECTRICAL TEST REQUIRE E TS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup Group B and D End Point Electrical Parameters 1,2,3 1, after burn-in divided by the total number of devices submitted for burn- (Method 5005) in in that lot shall be used to determine the percent for the lot. * PDA Applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given. Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen- tation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 3