Datasheet ADE7751 (Analog Devices) - 2
| 制造商 | Analog Devices |
| 描述 | Energy Metering IC with On-Chip Fault Detection |
| 页数 / 页 | 16 / 2 — ADE7751–SPECIFICATIONS1, 2 (AVDD = DVDD = 5 V. 5%, AGND = DGND = 0 V, … |
| 文件格式/大小 | PDF / 433 Kb |
| 文件语言 | 英语 |
ADE7751–SPECIFICATIONS1, 2 (AVDD = DVDD = 5 V. 5%, AGND = DGND = 0 V, On-Chip Reference,
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ADE7751–SPECIFICATIONS1, 2 (AVDD = DVDD = 5 V
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5%, AGND = DGND = 0 V, On-Chip Reference, CLKIN = 3.58 MHz, TMIN to TMAX = –40
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C to +85
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C.) Parameter Value Unit Test Conditions/Comments
ACCURACY3 Measurement Error1 on Channels 1 and 2 One Channel with Full-Scale Signal (±660 mV) Gain = 1 0.1 % Reading typ Over a Dynamic Range 500 to 1 Gain = 2 0.1 % Reading typ Over a Dynamic Range 500 to 1 Gain = 8 0.1 % Reading typ Over a Dynamic Range 500 to 1 Gain = 16 0.1 % Reading typ Over a Dynamic Range 500 to 1 Phase Error1 between Channels Line Frequency = 45 Hz to 55 Hz V1 Phase Lead 37° (PF = 0.8 Capacitive) ±0.1 Degrees(°) max AC/DC = 0 and AC/DC = 1 V1 Phase Lag 60° (PF = 0.5 Inductive) ±0.1 Degrees(°) max AC/DC = 0 and AC/DC = 1 AC Power Supply Rejection1 AC/DC = 1, S0 = S1 = 1, G0 = G1 = 0 Output Frequency Variation (CF) 0.2 % Reading typ V1 = 100 mV rms, V2 = 100 mV rms @ 50 Hz Ripple on AVDD of 200 mV rms @ 100 Hz DC Power Supply Rejection1 AC/DC = 1, S0 = S1 = 1, G0 = G1 = 0 Output Frequency Variation (CF) ±0.3 % Reading typ V1 = 100 mV rms, V2 = 100 mV rms, AVDD = DVDD = 5 V ± 250 mV FAULT DETECTION1, 4 See Fault Detection Section Fault Detection Threshold Inactive i/p <> Active i/p 12.5 % typ (V1A or V1B Active) Input Swap Threshold Inactive i/p > Active i/p 14 % of Active typ (V1A or V1B Active) Accuracy Fault Mode Operation V1A Active, V1B = AGND 0.1 % Reading typ Over a Dynamic Range 500 to 1 V1B Active, V1A = AGND 0.1 % Reading typ Over a Dynamic Range 500 to 1 Fault Detection Delay 3 Second typ Swap Delay 3 Second typ ANALOG INPUTS See Analog Inputs Section Maximum Signal Levels ±1 V max V1A, V1B, V1N, V2N, and V2P to AGND Input Impedance (DC) 390 kΩ min CLKIN = 3.58 MHz Bandwidth 14 kHz typ CLKIN/256, CLKIN = 3.58 MHz ADC Offset Error1 ±25 mV max See Terminology and Typical Performance Characteristics Gain Error1 ±10 % Ideal typ External 2.5 V Reference, Gain = 1, V1 = V2 = 660 mV dc Gain Error Match1 ±0.4 % Ideal typ External 2.5 V Reference REFERENCE INPUT REFIN/OUT Input Voltage Range 2.7 V max 2.5 V + 8% 2.3 V min 2.5 V – 8% Input Impedance 3.2 kΩ min Input Capacitance 10 pF max ON-CHIP REFERENCE Nominal 2.5 V Reference Error ±200 mV max Temperature Coefficient ±30 ppm/°C typ CLKIN Note All Specifications for CLKIN of 3.58 MHz Input Clock Frequency 4 MHz max 1 MHz min LOGIC INPUTS4 SCF, S0, S1, AC/DC, RESET, G0, and G1 Input High Voltage, VINH 2.4 V min DVDD = 5 V ± 5% Input Low Voltage, VINL 0.8 V max DVDD = 5 V ± 5% Input Current, I ± IN 3 µA max Typically 10 nA, VIN = 0 V to DVDD Input Capacitance, CIN 10 pF max –2– REV. 0
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5%, AGND = DGND = 0 V, On-Chip Reference, CLKIN = 3.58 MHz, TMIN to TMAX = –40
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C to +85
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C.) Parameter Value Unit Test Conditions/Comments
ACCURACY3 Measurement Error1 on Channels 1 and 2 One Channel with Full-Scale Signal (±660 mV) Gain = 1 0.1 % Reading typ Over a Dynamic Range 500 to 1 Gain = 2 0.1 % Reading typ Over a Dynamic Range 500 to 1 Gain = 8 0.1 % Reading typ Over a Dynamic Range 500 to 1 Gain = 16 0.1 % Reading typ Over a Dynamic Range 500 to 1 Phase Error1 between Channels Line Frequency = 45 Hz to 55 Hz V1 Phase Lead 37° (PF = 0.8 Capacitive) ±0.1 Degrees(°) max AC/DC = 0 and AC/DC = 1 V1 Phase Lag 60° (PF = 0.5 Inductive) ±0.1 Degrees(°) max AC/DC = 0 and AC/DC = 1 AC Power Supply Rejection1 AC/DC = 1, S0 = S1 = 1, G0 = G1 = 0 Output Frequency Variation (CF) 0.2 % Reading typ V1 = 100 mV rms, V2 = 100 mV rms @ 50 Hz Ripple on AVDD of 200 mV rms @ 100 Hz DC Power Supply Rejection1 AC/DC = 1, S0 = S1 = 1, G0 = G1 = 0 Output Frequency Variation (CF) ±0.3 % Reading typ V1 = 100 mV rms, V2 = 100 mV rms, AVDD = DVDD = 5 V ± 250 mV FAULT DETECTION1, 4 See Fault Detection Section Fault Detection Threshold Inactive i/p <> Active i/p 12.5 % typ (V1A or V1B Active) Input Swap Threshold Inactive i/p > Active i/p 14 % of Active typ (V1A or V1B Active) Accuracy Fault Mode Operation V1A Active, V1B = AGND 0.1 % Reading typ Over a Dynamic Range 500 to 1 V1B Active, V1A = AGND 0.1 % Reading typ Over a Dynamic Range 500 to 1 Fault Detection Delay 3 Second typ Swap Delay 3 Second typ ANALOG INPUTS See Analog Inputs Section Maximum Signal Levels ±1 V max V1A, V1B, V1N, V2N, and V2P to AGND Input Impedance (DC) 390 kΩ min CLKIN = 3.58 MHz Bandwidth 14 kHz typ CLKIN/256, CLKIN = 3.58 MHz ADC Offset Error1 ±25 mV max See Terminology and Typical Performance Characteristics Gain Error1 ±10 % Ideal typ External 2.5 V Reference, Gain = 1, V1 = V2 = 660 mV dc Gain Error Match1 ±0.4 % Ideal typ External 2.5 V Reference REFERENCE INPUT REFIN/OUT Input Voltage Range 2.7 V max 2.5 V + 8% 2.3 V min 2.5 V – 8% Input Impedance 3.2 kΩ min Input Capacitance 10 pF max ON-CHIP REFERENCE Nominal 2.5 V Reference Error ±200 mV max Temperature Coefficient ±30 ppm/°C typ CLKIN Note All Specifications for CLKIN of 3.58 MHz Input Clock Frequency 4 MHz max 1 MHz min LOGIC INPUTS4 SCF, S0, S1, AC/DC, RESET, G0, and G1 Input High Voltage, VINH 2.4 V min DVDD = 5 V ± 5% Input Low Voltage, VINL 0.8 V max DVDD = 5 V ± 5% Input Current, I ± IN 3 µA max Typically 10 nA, VIN = 0 V to DVDD Input Capacitance, CIN 10 pF max –2– REV. 0