Datasheet ACT81460 (Active-Semi) - 8
制造商 | Active-Semi |
描述 | Low Power PMIC With Integrated Linear Charger |
页数 / 页 | 60 / 8 — ACT81460. Rev 1.0, 18-Dec-2018. ABSOLUTE MAXIMUM RATINGS (NOTE 1). … |
修订版 | 1.0 |
文件格式/大小 | PDF / 5.3 Mb |
文件语言 | 英语 |
ACT81460. Rev 1.0, 18-Dec-2018. ABSOLUTE MAXIMUM RATINGS (NOTE 1). PARAMETER. VALUE. UNIT. ESD RATINGS. TEST CONDITIONS
该数据表的模型线
文件文字版本
ACT81460 Rev 1.0, 18-Dec-2018 ABSOLUTE MAXIMUM RATINGS (NOTE 1) PARAMETER VALUE UNIT
All Pins to GND unless stated otherwise below -0.3 to 6.0 V nPBIN/PWREN, GPIO 1,2,3 (nIRQ, nRESET, nCHGSTAT), ISET, NTC -0.3 to 6.0 V VIN to PGNDx -0.3 to 22.0 V VSYS(AVIN), VBAT, VINLx, VINLSx, VINBx, VINBB to PGNDx -0.3 to 6.0 V OUTLS1,2,3 & OUTL1,2,3 -0.3 to VSYS voltage V VBBST -0.3 to 6.0 V SWBBx to PGNDx -1.0 to VBBST + 1.0 V VBST -0.3 to 21 V SWBST to PGNDx -1.0 to VBST + 1.0 V VIN_IO -0.3 to 6.0 V ISNS to PGNDx -0.3 to VBST V FBx to PGNDx -0.3 to VINBx V SWx to PGNDx -1.0 to VINBx + 1 V AGND, PGNDx -0.3 to + 0.3 V Junction to Ambient Thermal Resistance (Note 2) 40 °C/W Operating Ambient Temperature Range -40 to 85 °C Operating Junction Temperature -40 to 150 °C Storage Temperature -55 to 150 °C Note1: Do not exceed these limits to prevent damage to the IC. Exposure to absolute maximum rating conditions for long periods may affect IC reliability. Note2: Measured on Active-Semi Evaluation Kit
ESD RATINGS PARAMETER TEST CONDITIONS VALUE UNIT
V_ESD_HMB (All pins) Human body Model per JEDEC JS-001 +/- 2000 V V_ESD_CDM (All pins) Charged device model per JEDEC JS-002 +/- 1000 V
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