Datasheet MMBT3906T (ON Semiconductor) - 3
| 制造商 | ON Semiconductor |
| 描述 | PNP Bipolar Transistor |
| 页数 / 页 | 7 / 3 — MMBT3906TT1. Figure 1. Normalized Thermal Response. Figure 2. Delay and … |
| 修订版 | 3 |
| 文件格式/大小 | PDF / 97 Kb |
| 文件语言 | 英语 |
MMBT3906TT1. Figure 1. Normalized Thermal Response. Figure 2. Delay and Rise Time. Figure 3. Storage and Fall Time
该数据表的模型线
文件文字版本
MMBT3906TT1
1.0 ANCE D = 0.5 0.2 RESIST 0.1 0.1 0.05 THERMAL 0.02 0.01 0.01 TRANSIENT SINGLE PULSE 0.001 0.00001 0.0001 0.001 0.01 0.1 1.0 10 100 1000 r(t), NORMALIZED t, TIME (s)
Figure 1. Normalized Thermal Response
3 V 3 V < 1 ns +9.1 V 275 275 < 1 ns 10 k 10 k 0 CS < 4 pF* 1N916 CS < 4 pF* +10.6 V 300 ns 10 < t1 < 500 ms t 10.9 V DUTY CYCLE = 2% 1 DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 2. Delay and Rise Time Figure 3. Storage and Fall Time Equivalent Test Circuit Equivalent Test Circuit www.onsemi.com 3
1.0 ANCE D = 0.5 0.2 RESIST 0.1 0.1 0.05 THERMAL 0.02 0.01 0.01 TRANSIENT SINGLE PULSE 0.001 0.00001 0.0001 0.001 0.01 0.1 1.0 10 100 1000 r(t), NORMALIZED t, TIME (s)
Figure 1. Normalized Thermal Response
3 V 3 V < 1 ns +9.1 V 275 275 < 1 ns 10 k 10 k 0 CS < 4 pF* 1N916 CS < 4 pF* +10.6 V 300 ns 10 < t1 < 500 ms t 10.9 V DUTY CYCLE = 2% 1 DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 2. Delay and Rise Time Figure 3. Storage and Fall Time Equivalent Test Circuit Equivalent Test Circuit www.onsemi.com 3