link to page 7 link to page 7 link to page 7 AD6641AD6641-500Parameter1TempMinTypMaxUnit LOGIC OUTPUTS DDR LVDS Mode (PCLK±, PD[5:0]±, PDOR±) Logic Compliance Full LVDS VOD Differential Output Voltage Full 247 454 mV VOS Output Offset Voltage Full 1.125 1.375 V Parallel CMOS Mode (PCLK±, PD[11:0]) Logic Compliance Full CMOS High Level Output Voltage Full DRVDD − 0.05 V Low Level Output Voltage Full DRGND + 0.05 V Output Coding Twos complement, Gray code, or offset binary (default) 1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and information about how these tests were completed. 2 5 pF loading. SWITCHING SPECIFICATIONS AVDD = 1.9 V, DRVDD = 1.9 V, TMIN = −40°C, TMAX = +85°C, fIN = −1.0 dBFS, full scale = 1.5 V, unless otherwise noted. Table 4.AD6641-500Parameter1TempMinTypMaxUnit OUTPUT DATA RATE Maximum Output Data Rate (Decimate by 8 at 500 MSPS Sample Rate, Parallel CMOS Full 62.5 MHz or DDR LVDS Mode Interface) Maximum Output Data Rate (Decimate by 8 at 500 MSPS Sample Rate, SPORT Mode) Full 62.5 MHz PULSE WIDTH/PERIOD (CLK±) CLK± Pulse Width High (tCH) Full 1 ns CLK± Pulse Width Low (tCL) Full 1 ns Rise Time (tR) (20% to 80%) 25°C 0.2 ns Fall Time (tF) (20% to 80%) 25°C 0.2 ns PULSE WIDTH/PERIOD (PCLK±, DDR LVDS MODE) PCLK± Pulse Width High (tPCLK_CH) Full 8 ns PCLK± Period (tPCLK) Full 16 ns Propagation Delay (tCPD, CLK± to PCLK±) Full ±0.1 ns Rise Time (tR) (20% to 80%) 25°C 0.2 ns Fall Time (tF) (20% to 80%) 25°C 0.2 ns Data to PCLK Skew (tSKEW) Full 0.2 ns SERIAL PORT OUTPUT TIMING2 SP_SDFS Propagation Delay (tDSDFS) Full 3 ns SP_SDO Propagation Delay (tDSDO) Full 3 ns SERIAL PORT INPUT TIMING SP_SDFS Setup Time (tSSF) Full 2 ns SP_SDFS Hold Time (tHSF) Full 2 ns FILL± INPUT TIMING FILL± Setup Time (tSfill) Full 0.5 ns FILL± Hold Time (tHfill) Full 0.7 ns APERTURE DELAY (tA) 25°C 0.85 ns APERTURE UNCERTAINTY (JITTER, tJ) 25°C 80 fs rms 1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and information about how these tests were completed. 2 5 pF loading. Rev. 0 | Page 7 of 28 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY PRODUCT HIGHLIGHTS SPECIFICATIONS DC SPECIFICATIONS AC SPECIFICATIONS DIGITAL SPECIFICATIONS SWITCHING SPECIFICATIONS SPI TIMING REQUIREMENTS Timing Diagrams ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS EQUIVALENT CIRCUITS SPI REGISTER MAP THEORY OF OPERATION FIFO OPERATION Single Capture Mode Fill Pin Timing Dump Pin Timing SPORT Master Mode (Single Capture) Fill Pulse (1) Empty Signal (2) Full Signal (3) Dump Signal (4)—Transition to High SCLK Signal (5) SDFS Signal (6) Dump Signal (7)—Transition to Low Empty Signal (8)—Transition to High Parallel Master Mode (Single Capture) Fill Pulse (1) Empty Signal (2) Full Signal (3) Dump Signal (4)—Transition to High PCLK± Signal (5) PD[11:0] Signal (6) Dump Signal (7)—Transition to Low Empty Signal (8)—Transition to High Continuous Capture Mode FIFO OUTPUT INTERFACES SPORT Interface Serial Data Frame (Serial Bus Master) CMOS Output Interface LVDS Output Interface ANALOG INPUT AND VOLTAGE REFERENCE VREF CONFIGURATION USING THE SPI OUTLINE DIMENSIONS ORDERING GUIDE