Datasheet LME49710 (National Semiconductor) - 7
| 制造商 | National Semiconductor |
| 描述 | High Performance, High Fidelity Audio Operational Amplifier |
| 页数 / 页 | 28 / 7 — LME49710. THD+N vs Output Voltage. = 17V, V. = –17V, R. = 2.5V, V. = … |
| 文件格式/大小 | PDF / 840 Kb |
| 文件语言 | 英语 |
LME49710. THD+N vs Output Voltage. = 17V, V. = –17V, R. = 2.5V, V. = –2.5V, R. = 15V, V. = –15V, R = 10k. = 12V, V. = –12V, R = 10k
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LME49710 THD+N vs Output Voltage THD+N vs Output Voltage V = 17V, V = –17V, R
= 600Ω
V = 2.5V, V = –2.5V, R
= 600Ω
CC EE L CC EE L
20210481 20210472
THD+N vs Output Voltage THD+N vs Output Voltage V = 15V, V = –15V, R = 10k
Ω
V = 12V, V = –12V, R = 10k
Ω
CC EE L CC EE L
20210477 20210474
THD+N vs Output Voltage THD+N vs Output Voltage V = 17V, V = –17V, R = 10k
Ω
V = 2.5V, V = –2.5V, R = 10k
Ω
CC EE L CC EE L
20210480 20210471 7 www.national.com Document Outline LME49710 General Description Key Specifications Features Applications Typical Application FIGURE 1. Passively Equalized RIAA Phono Preamplifier Connection Diagrams Absolute Maximum Ratings Electrical Characteristics Typical Performance Characteristics Application Hints Noise Measurement Circuit Typical Applications Application Information DISTORTION MEASUREMENTS FIGURE 2. THD+N and IMD Distortion Test Circuit Revision History Physical Dimensions
= 600Ω
V = 2.5V, V = –2.5V, R
= 600Ω
CC EE L CC EE L
20210481 20210472
THD+N vs Output Voltage THD+N vs Output Voltage V = 15V, V = –15V, R = 10k
Ω
V = 12V, V = –12V, R = 10k
Ω
CC EE L CC EE L
20210477 20210474
THD+N vs Output Voltage THD+N vs Output Voltage V = 17V, V = –17V, R = 10k
Ω
V = 2.5V, V = –2.5V, R = 10k
Ω
CC EE L CC EE L
20210480 20210471 7 www.national.com Document Outline LME49710 General Description Key Specifications Features Applications Typical Application FIGURE 1. Passively Equalized RIAA Phono Preamplifier Connection Diagrams Absolute Maximum Ratings Electrical Characteristics Typical Performance Characteristics Application Hints Noise Measurement Circuit Typical Applications Application Information DISTORTION MEASUREMENTS FIGURE 2. THD+N and IMD Distortion Test Circuit Revision History Physical Dimensions